一种新的栅极电荷测量方法

Proceedings of the 2015 International Conference on Microelectronic Test Structures Pub Date : 2015-03-23 DOI:10.1109/ICMTS.2015.7106124

A. Mikata, H. Kakitani, R. Takeda, Alan Wadsworth

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引用次数: 0

摘要

不断提高的功率电路效率的驱动确保了栅极电荷(Qg)的测量将继续增长的重要性。在本文中，我们解释了一种新的Qg测量方法，解决了许多传统的Qg测量问题。概述的方法提供了相同的Qg曲线，通过传统的一遍高功率测量技术，使用一种新的方法，结合在低功率条件下测量的两个Qg曲线。

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A novel new gate charge measurement method

The drive for ever-increasing power circuit efficiencies ensures that the measurement of gate charge (Qg) will continue to grow in importance. In this paper, we explain a new Qg measurement method that solves many conventional Qg measurement issues. The outlined method supplies the same Qg curve obtained by traditional one-pass high-power measurement techniques using a new method that combines two Qg curves measured under lower power conditions.

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Proceedings of the 2015 International Conference on Microelectronic Test Structures

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