ic故障和无故障的当前行为和对诊断的影响

Proceedings 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Cat. No.98EX223) Pub Date : 1998-11-02 DOI:10.1109/DFTVS.1998.732167

C. Thibeault, L. Boisvert

{"title":"ic故障和无故障的当前行为和对诊断的影响","authors":"C. Thibeault, L. Boisvert","doi":"10.1109/DFTVS.1998.732167","DOIUrl":null,"url":null,"abstract":"The purpose of this paper is to analyze the current behavior of faulty and fault free integrated circuits (ICs) and its impact on diagnosis. More specifically, we first show that normal sub-threshold current can be modeled by a Gaussian distribution. Then, we investigate faulty IC current variations caused to the load connected to nodes involved in bridging faults. Finally, we propose some modifications to a diagnosis method based on maximum likelihood estimation to deal with these behaviors.","PeriodicalId":245879,"journal":{"name":"Proceedings 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Cat. No.98EX223)","volume":"16 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1998-11-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":"{\"title\":\"Can the current behavior of faulty and fault-free ICs and the impact on diagnosis\",\"authors\":\"C. Thibeault, L. Boisvert\",\"doi\":\"10.1109/DFTVS.1998.732167\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The purpose of this paper is to analyze the current behavior of faulty and fault free integrated circuits (ICs) and its impact on diagnosis. More specifically, we first show that normal sub-threshold current can be modeled by a Gaussian distribution. Then, we investigate faulty IC current variations caused to the load connected to nodes involved in bridging faults. Finally, we propose some modifications to a diagnosis method based on maximum likelihood estimation to deal with these behaviors.\",\"PeriodicalId\":245879,\"journal\":{\"name\":\"Proceedings 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Cat. No.98EX223)\",\"volume\":\"16 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1998-11-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"8\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Cat. No.98EX223)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DFTVS.1998.732167\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Cat. No.98EX223)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DFTVS.1998.732167","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 8

摘要

本文的目的是分析故障和无故障集成电路的电流行为及其对诊断的影响。更具体地说，我们首先证明了正常的亚阈值电流可以用高斯分布来建模。然后，我们研究了连接到桥接故障节点的负载所引起的故障IC电流变化。最后，我们对基于极大似然估计的诊断方法进行了一些改进，以处理这些行为。

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Can the current behavior of faulty and fault-free ICs and the impact on diagnosis

The purpose of this paper is to analyze the current behavior of faulty and fault free integrated circuits (ICs) and its impact on diagnosis. More specifically, we first show that normal sub-threshold current can be modeled by a Gaussian distribution. Then, we investigate faulty IC current variations caused to the load connected to nodes involved in bridging faults. Finally, we propose some modifications to a diagnosis method based on maximum likelihood estimation to deal with these behaviors.

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来源期刊

Proceedings 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Cat. No.98EX223)

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