测试256k字/单次/16位高速缓存DRAM (CDRAM)

Proceedings., International Test Conference Pub Date : 1994-10-02 DOI:10.1109/TEST.1994.527970

Y. Konishi, T. Ogawa, M. Kumanoya

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引用次数: 1

摘要

高速缓存DRAM (CDRAM)是一种很有前途的高速存储器，它可以消除计算机系统中的“内存瓶颈”，实现多媒体系统的“统一存储”。CDRAM的测试分为几个子测试步骤。CDRAM的测试包括SRAM和DRAM的分离测试和并发测试。ATE的双pg是高速和并发操作测试的强大工具。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Testing 256k word/spl times/16 bit Cache DRAM (CDRAM)

Cache DRAM (CDRAM) is a promising high speed memory which can eliminate "memory bottleneck" in a computer system and can realize "unified memory" for a multi-media system. Test of a CDRAM is broken down to several sub-test steps. Testing a CDRAM comprises separated test and concurrent test of SRAM and DRAM. Dual PGs of ATE are powerful tools both for high speed and concurrent operation tests.

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Proceedings., International Test Conference

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