{"title":"AXIe®:开放式架构测试系统标准","authors":"A. Czamara","doi":"10.1109/TEST.2010.5699293","DOIUrl":null,"url":null,"abstract":"A new open architecture test system standard, AXIe<sup>®</sup> is introduced. A summary of the two initial standards is presented with a focus on explaining why a standard is needed, and detailing success metrics applicable to ATE testing, including the impact of AXIe<sup>®</sup> on cost of test.","PeriodicalId":265156,"journal":{"name":"2010 IEEE International Test Conference","volume":"54 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"AXIe®: Open architecture test system standard\",\"authors\":\"A. Czamara\",\"doi\":\"10.1109/TEST.2010.5699293\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A new open architecture test system standard, AXIe<sup>®</sup> is introduced. A summary of the two initial standards is presented with a focus on explaining why a standard is needed, and detailing success metrics applicable to ATE testing, including the impact of AXIe<sup>®</sup> on cost of test.\",\"PeriodicalId\":265156,\"journal\":{\"name\":\"2010 IEEE International Test Conference\",\"volume\":\"54 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2010 IEEE International Test Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TEST.2010.5699293\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 IEEE International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.2010.5699293","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A new open architecture test system standard, AXIe® is introduced. A summary of the two initial standards is presented with a focus on explaining why a standard is needed, and detailing success metrics applicable to ATE testing, including the impact of AXIe® on cost of test.