{"title":"无面积、性能和功率开销的多比特扰流缓解技术","authors":"T. Uemura, R. Tanabe, H. Matusyama","doi":"10.1109/IRPS.2012.6241846","DOIUrl":null,"url":null,"abstract":"In this work, we propose a technique for mitigating multi-bit-upset (MBU) which cannot be corrected by Error-Correction-Code (ECC) with using bit-line alternation and narrow deep-N-well. This technique mitigates MBU without area, performance and power overhead. The mitigation efficiency is evaluated with alpha and neutron acceleration experiments. The experimental results show excellent mitigation efficiency of the proposed technique.","PeriodicalId":341663,"journal":{"name":"2012 IEEE International Reliability Physics Symposium (IRPS)","volume":"12 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-04-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":"{\"title\":\"Mitigation technique against multi-bit-upset without area, performance and power overhead\",\"authors\":\"T. Uemura, R. Tanabe, H. Matusyama\",\"doi\":\"10.1109/IRPS.2012.6241846\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this work, we propose a technique for mitigating multi-bit-upset (MBU) which cannot be corrected by Error-Correction-Code (ECC) with using bit-line alternation and narrow deep-N-well. This technique mitigates MBU without area, performance and power overhead. The mitigation efficiency is evaluated with alpha and neutron acceleration experiments. The experimental results show excellent mitigation efficiency of the proposed technique.\",\"PeriodicalId\":341663,\"journal\":{\"name\":\"2012 IEEE International Reliability Physics Symposium (IRPS)\",\"volume\":\"12 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-04-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"9\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2012 IEEE International Reliability Physics Symposium (IRPS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IRPS.2012.6241846\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 IEEE International Reliability Physics Symposium (IRPS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IRPS.2012.6241846","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Mitigation technique against multi-bit-upset without area, performance and power overhead
In this work, we propose a technique for mitigating multi-bit-upset (MBU) which cannot be corrected by Error-Correction-Code (ECC) with using bit-line alternation and narrow deep-N-well. This technique mitigates MBU without area, performance and power overhead. The mitigation efficiency is evaluated with alpha and neutron acceleration experiments. The experimental results show excellent mitigation efficiency of the proposed technique.