2012 IEEE International Reliability Physics Symposium (IRPS)

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2012 IEEE International Reliability Physics Symposium (IRPS) - 最新文献

Multi-technique study of defect generation in high-k gate stacks

Pub Date : 2012-04-15 DOI: 10.1109/IRPS.2012.6241853 D. Veksler, G. Bersuker, H. Madan, L. Vandelli, M. Minakais, K. Matthews, C. Young, S. Datta, C. Hobbs, P. Kirsch

Impact of program/erase stress induced hole current on data retention degradation for MONOS memories

Pub Date : 2012-04-15 DOI: 10.1109/IRPS.2012.6241772 S. Fujii, R. Fujitsuka, K. Sekine, H. Kusai, K. Sakuma, M. Koyama

Correlation of single trapping and detrapping effects in drain and gate currents of nanoscaled nFETs and pFETs

Pub Date : 2012-04-15 DOI: 10.1109/IRPS.2012.6241935 M. Toledano-Luque, B. Kaczer, E. Simoen, R. Degraeve, J. Franco, P. Roussel, T. Grasser, G. Groeseneken

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