{"title":"SoC测试数据压缩中的块标记与更新编码","authors":"Lei Zhang, Huaguo Liang, Wenfa Zhan, Cuiyun Jiang","doi":"10.1109/ATS.2007.57","DOIUrl":null,"url":null,"abstract":"A novel test data compression coding scheme, block marking and updating coding, is proposed in this paper. Test data in the test set was divided into successive fixed-length vectors, called blocks, and then they were marked according to their compatibility compared with a reference vector. An operation that is similar to difference and a technique that strategically fills in don 't-care bits are combined to increase the probabilities of compatibility or inverse compatibility. It effectively compresses test data and its decompression structure is very simple. Experimental results of ISCAS-89 benchmark circuits show that the scheme is very effective.","PeriodicalId":289969,"journal":{"name":"16th Asian Test Symposium (ATS 2007)","volume":"4 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-10-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Block Marking and Updating Coding in Test Data Compression for SoC\",\"authors\":\"Lei Zhang, Huaguo Liang, Wenfa Zhan, Cuiyun Jiang\",\"doi\":\"10.1109/ATS.2007.57\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A novel test data compression coding scheme, block marking and updating coding, is proposed in this paper. Test data in the test set was divided into successive fixed-length vectors, called blocks, and then they were marked according to their compatibility compared with a reference vector. An operation that is similar to difference and a technique that strategically fills in don 't-care bits are combined to increase the probabilities of compatibility or inverse compatibility. It effectively compresses test data and its decompression structure is very simple. Experimental results of ISCAS-89 benchmark circuits show that the scheme is very effective.\",\"PeriodicalId\":289969,\"journal\":{\"name\":\"16th Asian Test Symposium (ATS 2007)\",\"volume\":\"4 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-10-08\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"16th Asian Test Symposium (ATS 2007)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ATS.2007.57\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"16th Asian Test Symposium (ATS 2007)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS.2007.57","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Block Marking and Updating Coding in Test Data Compression for SoC
A novel test data compression coding scheme, block marking and updating coding, is proposed in this paper. Test data in the test set was divided into successive fixed-length vectors, called blocks, and then they were marked according to their compatibility compared with a reference vector. An operation that is similar to difference and a technique that strategically fills in don 't-care bits are combined to increase the probabilities of compatibility or inverse compatibility. It effectively compresses test data and its decompression structure is very simple. Experimental results of ISCAS-89 benchmark circuits show that the scheme is very effective.