{"title":"从卡住测试集计算卡住打开故障的鲁棒性测试的启发式方法","authors":"S. Chakravarty","doi":"10.1109/EDAC.1992.205968","DOIUrl":null,"url":null,"abstract":"Heuristics for identifying stuck-open faults for which a robust test can be computed from any stuck-at-test set are presented. Experimental results show that these heuristics can be used to compute robust tests for a large percentage of stuck-upon faults. Since stuck-at test generation is considerably faster than computing a robust test-pair for a given stuck-open fault, these heuristics can be used to speed up the process of computing robust tests for stuck-open faults. The author addresses the problem of computing robust tests for stuck-open faults in static CMOS circuits consisting of NOT, NAND, NOR, AND and OR gates.<<ETX>>","PeriodicalId":285019,"journal":{"name":"[1992] Proceedings The European Conference on Design Automation","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-03-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Heuristics for computing robust tests for stuck-open faults from stuck-at test sets\",\"authors\":\"S. Chakravarty\",\"doi\":\"10.1109/EDAC.1992.205968\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Heuristics for identifying stuck-open faults for which a robust test can be computed from any stuck-at-test set are presented. Experimental results show that these heuristics can be used to compute robust tests for a large percentage of stuck-upon faults. Since stuck-at test generation is considerably faster than computing a robust test-pair for a given stuck-open fault, these heuristics can be used to speed up the process of computing robust tests for stuck-open faults. The author addresses the problem of computing robust tests for stuck-open faults in static CMOS circuits consisting of NOT, NAND, NOR, AND and OR gates.<<ETX>>\",\"PeriodicalId\":285019,\"journal\":{\"name\":\"[1992] Proceedings The European Conference on Design Automation\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1992-03-16\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"[1992] Proceedings The European Conference on Design Automation\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EDAC.1992.205968\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"[1992] Proceedings The European Conference on Design Automation","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EDAC.1992.205968","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Heuristics for computing robust tests for stuck-open faults from stuck-at test sets
Heuristics for identifying stuck-open faults for which a robust test can be computed from any stuck-at-test set are presented. Experimental results show that these heuristics can be used to compute robust tests for a large percentage of stuck-upon faults. Since stuck-at test generation is considerably faster than computing a robust test-pair for a given stuck-open fault, these heuristics can be used to speed up the process of computing robust tests for stuck-open faults. The author addresses the problem of computing robust tests for stuck-open faults in static CMOS circuits consisting of NOT, NAND, NOR, AND and OR gates.<>
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