铜材料的XPS价态分析研究

H. Younan, Shen Yue, Li Kai, W. J. Yuan, C. Y. Shen, Chen Yixin, Fu Chao, Li Xiaomin
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引用次数: 5

摘要

XPS分析技术可用于价态分析。然而,由于XPS能量分辨率的限制,某些元素的价态很难区分。在本研究中,使用扫描XPS显微镜PHI Quantera II分析和鉴定Cu中的Cu2O。虽然该设备具有良好的能量分辨率(0.48 eV),但由于其2p3能量差(0.20 eV)小于XPS工具的能量分辨率,因此仍然难以区分Cu+和Cu。本文将研究利用XPS光谱中的LMM能量峰来鉴别Cu+和Cu的方法。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Studies on XPS valence state analysis of copper materials
XPS analysis technique can be used for valence state analysis. However, due to the limitation of the energy resolution of XPS, it can be difficult to differentiate the valence state of some elements. In this study, the Scanning XPS Microscope PHI Quantera II was used to analyze and identify Cu2O from Cu. Although the equipment possesses good energy resolution (0.48 eV), it is still difficult to distinguish Cu+ from Cu as their difference of the 2p3 energy (0.20 eV) is less than the energy resolution of the XPS tool. In this paper, we will study the method to identify and distinguish Cu+ from Cu by using LMM energy peak in XPS spectra.
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