H. Younan, Shen Yue, Li Kai, W. J. Yuan, C. Y. Shen, Chen Yixin, Fu Chao, Li Xiaomin
{"title":"铜材料的XPS价态分析研究","authors":"H. Younan, Shen Yue, Li Kai, W. J. Yuan, C. Y. Shen, Chen Yixin, Fu Chao, Li Xiaomin","doi":"10.1109/IEMT.2016.7761945","DOIUrl":null,"url":null,"abstract":"XPS analysis technique can be used for valence state analysis. However, due to the limitation of the energy resolution of XPS, it can be difficult to differentiate the valence state of some elements. In this study, the Scanning XPS Microscope PHI Quantera II was used to analyze and identify Cu2O from Cu. Although the equipment possesses good energy resolution (0.48 eV), it is still difficult to distinguish Cu+ from Cu as their difference of the 2p3 energy (0.20 eV) is less than the energy resolution of the XPS tool. In this paper, we will study the method to identify and distinguish Cu+ from Cu by using LMM energy peak in XPS spectra.","PeriodicalId":237235,"journal":{"name":"2016 IEEE 37th International Electronics Manufacturing Technology (IEMT) & 18th Electronics Materials and Packaging (EMAP) Conference","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Studies on XPS valence state analysis of copper materials\",\"authors\":\"H. Younan, Shen Yue, Li Kai, W. J. Yuan, C. Y. Shen, Chen Yixin, Fu Chao, Li Xiaomin\",\"doi\":\"10.1109/IEMT.2016.7761945\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"XPS analysis technique can be used for valence state analysis. However, due to the limitation of the energy resolution of XPS, it can be difficult to differentiate the valence state of some elements. In this study, the Scanning XPS Microscope PHI Quantera II was used to analyze and identify Cu2O from Cu. Although the equipment possesses good energy resolution (0.48 eV), it is still difficult to distinguish Cu+ from Cu as their difference of the 2p3 energy (0.20 eV) is less than the energy resolution of the XPS tool. In this paper, we will study the method to identify and distinguish Cu+ from Cu by using LMM energy peak in XPS spectra.\",\"PeriodicalId\":237235,\"journal\":{\"name\":\"2016 IEEE 37th International Electronics Manufacturing Technology (IEMT) & 18th Electronics Materials and Packaging (EMAP) Conference\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 IEEE 37th International Electronics Manufacturing Technology (IEMT) & 18th Electronics Materials and Packaging (EMAP) Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IEMT.2016.7761945\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE 37th International Electronics Manufacturing Technology (IEMT) & 18th Electronics Materials and Packaging (EMAP) Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEMT.2016.7761945","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Studies on XPS valence state analysis of copper materials
XPS analysis technique can be used for valence state analysis. However, due to the limitation of the energy resolution of XPS, it can be difficult to differentiate the valence state of some elements. In this study, the Scanning XPS Microscope PHI Quantera II was used to analyze and identify Cu2O from Cu. Although the equipment possesses good energy resolution (0.48 eV), it is still difficult to distinguish Cu+ from Cu as their difference of the 2p3 energy (0.20 eV) is less than the energy resolution of the XPS tool. In this paper, we will study the method to identify and distinguish Cu+ from Cu by using LMM energy peak in XPS spectra.