{"title":"通过LFSR密钥保护IEEE 1687-2014标准仪器访问","authors":"Hejia Liu, V. Agrawal","doi":"10.1109/ATS.2015.23","DOIUrl":null,"url":null,"abstract":"IEEE 1687-2014 Standard provides an effective method for accessing on-chip instruments for testing, debugging and board configuration. The standard, however, causes a safety problem because anyone can access the chip instruments, set inputs and obtain safety critical information. In recent work, a lock in the segment insertion bit (SIB) and a corresponding unlocking key application procedure have been proposed for securing the 1687. This paper provides a linear feedback shift register (LFSR) based key generation mechanism that enhances the security of 1687 very significantly. By reconfiguring m (a small number) scan flip-flops into an LFSR that generates the key to unlock the SIB, we show a substantial increase in the expected break-in time.","PeriodicalId":256879,"journal":{"name":"2015 IEEE 24th Asian Test Symposium (ATS)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-11-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"30","resultStr":"{\"title\":\"Securing IEEE 1687-2014 Standard Instrumentation Access by LFSR Key\",\"authors\":\"Hejia Liu, V. Agrawal\",\"doi\":\"10.1109/ATS.2015.23\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"IEEE 1687-2014 Standard provides an effective method for accessing on-chip instruments for testing, debugging and board configuration. The standard, however, causes a safety problem because anyone can access the chip instruments, set inputs and obtain safety critical information. In recent work, a lock in the segment insertion bit (SIB) and a corresponding unlocking key application procedure have been proposed for securing the 1687. This paper provides a linear feedback shift register (LFSR) based key generation mechanism that enhances the security of 1687 very significantly. By reconfiguring m (a small number) scan flip-flops into an LFSR that generates the key to unlock the SIB, we show a substantial increase in the expected break-in time.\",\"PeriodicalId\":256879,\"journal\":{\"name\":\"2015 IEEE 24th Asian Test Symposium (ATS)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-11-22\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"30\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2015 IEEE 24th Asian Test Symposium (ATS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ATS.2015.23\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 IEEE 24th Asian Test Symposium (ATS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS.2015.23","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Securing IEEE 1687-2014 Standard Instrumentation Access by LFSR Key
IEEE 1687-2014 Standard provides an effective method for accessing on-chip instruments for testing, debugging and board configuration. The standard, however, causes a safety problem because anyone can access the chip instruments, set inputs and obtain safety critical information. In recent work, a lock in the segment insertion bit (SIB) and a corresponding unlocking key application procedure have been proposed for securing the 1687. This paper provides a linear feedback shift register (LFSR) based key generation mechanism that enhances the security of 1687 very significantly. By reconfiguring m (a small number) scan flip-flops into an LFSR that generates the key to unlock the SIB, we show a substantial increase in the expected break-in time.