仿真辅助EMMI技术在集成电路故障分析中定位电容缺陷

2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Pub Date : 2016-07-18 DOI:10.1109/IPFA.2016.7564287

Gaojie Wen, Li Tian, Diwei Fan, Jinrong Song, Jun Ren, Dong Wang, Xiaocui Li

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引用次数: 1

摘要

随着集成电路结构和功能的日益复杂化，对缺陷的精确定位也面临着越来越大的挑战。非破坏性分析策略将比以往任何时候都更加重要。本文提出了一种利用仿真EMMI分析来定位电容器缺陷的有效方法。当遇到反馈电路复杂的输出信号失效时，可以考虑采用这种无损策略。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Simulation assisting EMMI technical to locate defect on capacitor in integrated circuit failure analysis

Since the structure and function of IC (Integrated Circuit) is becoming complicated, locating the defect precisely is facing more challenges. Non-destructive analysis strategy would be much more important than ever before. This paper would present an efficient strategy to locate the defect on capacitor with simulation EMMI analysis. This non-destructive strategy can be considered when meet the output signal failed which with complicated feedback circuit.

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来源期刊

2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

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