{"title":"室温下使用氩射频等离子体激活与光滑金薄膜的晶圆键合","authors":"K. Okumura, E. Higurashi, T. Suga, K. Hagiwara","doi":"10.1109/LTB-3D.2014.6886165","DOIUrl":null,"url":null,"abstract":"Quartz glass wafers with smooth Au thin film (thickness: 30 nm, surface roughness Ra: 0.34 nm) were successfully bonded in ambient air at room temperature after Ar RF plasma activation process. The room temperature bonded glass wafers without any heat treatment showed a sufficiently high die-shear strength of 47~70 MPa. The application of this process to heterogeneous integration of GaAs on SiC enables improved thermal management in high power semiconductor lasers.","PeriodicalId":123514,"journal":{"name":"2014 4th IEEE International Workshop on Low Temperature Bonding for 3D Integration (LTB-3D)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-07-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"Room-temperature wafer bonding with smooth Au thin film in ambient air using Ar RF plasma activation\",\"authors\":\"K. Okumura, E. Higurashi, T. Suga, K. Hagiwara\",\"doi\":\"10.1109/LTB-3D.2014.6886165\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Quartz glass wafers with smooth Au thin film (thickness: 30 nm, surface roughness Ra: 0.34 nm) were successfully bonded in ambient air at room temperature after Ar RF plasma activation process. The room temperature bonded glass wafers without any heat treatment showed a sufficiently high die-shear strength of 47~70 MPa. The application of this process to heterogeneous integration of GaAs on SiC enables improved thermal management in high power semiconductor lasers.\",\"PeriodicalId\":123514,\"journal\":{\"name\":\"2014 4th IEEE International Workshop on Low Temperature Bonding for 3D Integration (LTB-3D)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2014-07-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2014 4th IEEE International Workshop on Low Temperature Bonding for 3D Integration (LTB-3D)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/LTB-3D.2014.6886165\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 4th IEEE International Workshop on Low Temperature Bonding for 3D Integration (LTB-3D)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/LTB-3D.2014.6886165","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Room-temperature wafer bonding with smooth Au thin film in ambient air using Ar RF plasma activation
Quartz glass wafers with smooth Au thin film (thickness: 30 nm, surface roughness Ra: 0.34 nm) were successfully bonded in ambient air at room temperature after Ar RF plasma activation process. The room temperature bonded glass wafers without any heat treatment showed a sufficiently high die-shear strength of 47~70 MPa. The application of this process to heterogeneous integration of GaAs on SiC enables improved thermal management in high power semiconductor lasers.