美国宇航局戈达德太空飞行中心单事件效应结果汇编

2016 IEEE Radiation Effects Data Workshop (REDW) Pub Date : 2016-07-11 DOI:10.1109/NSREC.2016.7891706

M. O’Bryan, K. Label, C. M. Szabo, Dakai Chen, M. Campola, M. Casey, J. Lauenstein, E. Wilcox, R. Ladbury, Stanley A. Ikpe, J. Pellish, M. Berg

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引用次数: 4

摘要

我们介绍了单事件效应(SEE)测试和分析的结果，研究了辐射对电子器件的影响。本文是对试验结果的总结。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Compendium of Single Event Effect Results from NASA Goddard Space Flight Center

We present the results of single event effect (SEE) testing and analysis investigating the effects of radiation on electronics. This paper is a summary of test results.

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来源期刊

2016 IEEE Radiation Effects Data Workshop (REDW)

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