{"title":"Cobham设计的智能电源开关控制器的单事件闭锁和总电离剂量特性","authors":"M. Von Thun, Younes Lotfi, T. Meade, A. Turnbull","doi":"10.1109/REDW51883.2020.9325838","DOIUrl":null,"url":null,"abstract":"Single event latch-up and total ionizing dose characterization data is presented for the newly designed and fabricated Cobham radiation-hardened Smart Power Switch Controller.","PeriodicalId":127384,"journal":{"name":"2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC)","volume":"23 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Single Event Latch-up and Total Ionizing Dose Characterization of a Cobham Designed Smart Power Switch Controller\",\"authors\":\"M. Von Thun, Younes Lotfi, T. Meade, A. Turnbull\",\"doi\":\"10.1109/REDW51883.2020.9325838\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Single event latch-up and total ionizing dose characterization data is presented for the newly designed and fabricated Cobham radiation-hardened Smart Power Switch Controller.\",\"PeriodicalId\":127384,\"journal\":{\"name\":\"2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC)\",\"volume\":\"23 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2020-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/REDW51883.2020.9325838\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/REDW51883.2020.9325838","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Single Event Latch-up and Total Ionizing Dose Characterization of a Cobham Designed Smart Power Switch Controller
Single event latch-up and total ionizing dose characterization data is presented for the newly designed and fabricated Cobham radiation-hardened Smart Power Switch Controller.
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