{"title":"DiRAM4接口的RDL和中间层设计","authors":"T. Nigussie, P. Franzon","doi":"10.1109/EPEPS.2016.7835408","DOIUrl":null,"url":null,"abstract":"This paper presents results of signal integrity study conducted on two packaging designs: redistribution layer (RDL) for face-to-face stacking and 2.5D interposer for lateral connection of four processor chips with high performance memory die having a bandwidth of 4Tb/s.","PeriodicalId":241629,"journal":{"name":"2016 IEEE 25th Conference on Electrical Performance Of Electronic Packaging And Systems (EPEPS)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"RDL and interposer design for DiRAM4 interfaces\",\"authors\":\"T. Nigussie, P. Franzon\",\"doi\":\"10.1109/EPEPS.2016.7835408\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents results of signal integrity study conducted on two packaging designs: redistribution layer (RDL) for face-to-face stacking and 2.5D interposer for lateral connection of four processor chips with high performance memory die having a bandwidth of 4Tb/s.\",\"PeriodicalId\":241629,\"journal\":{\"name\":\"2016 IEEE 25th Conference on Electrical Performance Of Electronic Packaging And Systems (EPEPS)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 IEEE 25th Conference on Electrical Performance Of Electronic Packaging And Systems (EPEPS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EPEPS.2016.7835408\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE 25th Conference on Electrical Performance Of Electronic Packaging And Systems (EPEPS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPEPS.2016.7835408","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
This paper presents results of signal integrity study conducted on two packaging designs: redistribution layer (RDL) for face-to-face stacking and 2.5D interposer for lateral connection of four processor chips with high performance memory die having a bandwidth of 4Tb/s.