{"title":"数字神经网络在线测试","authors":"S. Demidenko, V. Piuri","doi":"10.1109/ATS.1996.555174","DOIUrl":null,"url":null,"abstract":"On-line testing is a basic issue of any concurrent fault-tolerance policy. Error localisation within the neural network is necessary to provide information for hardware reconfiguration in order to achieve the system survival. In this paper, a concurrent approach for error localisation in digital neural networks is discussed and evaluated. Two techniques are applied: concurrent diagnosis with the use of data coding for error detection at neuron level and on-line localisation of the faulty neuron within the network.","PeriodicalId":215252,"journal":{"name":"Proceedings of the Fifth Asian Test Symposium (ATS'96)","volume":"11 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1996-11-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"On-line testing in digital neural networks\",\"authors\":\"S. Demidenko, V. Piuri\",\"doi\":\"10.1109/ATS.1996.555174\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"On-line testing is a basic issue of any concurrent fault-tolerance policy. Error localisation within the neural network is necessary to provide information for hardware reconfiguration in order to achieve the system survival. In this paper, a concurrent approach for error localisation in digital neural networks is discussed and evaluated. Two techniques are applied: concurrent diagnosis with the use of data coding for error detection at neuron level and on-line localisation of the faulty neuron within the network.\",\"PeriodicalId\":215252,\"journal\":{\"name\":\"Proceedings of the Fifth Asian Test Symposium (ATS'96)\",\"volume\":\"11 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1996-11-20\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the Fifth Asian Test Symposium (ATS'96)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ATS.1996.555174\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the Fifth Asian Test Symposium (ATS'96)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS.1996.555174","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
On-line testing is a basic issue of any concurrent fault-tolerance policy. Error localisation within the neural network is necessary to provide information for hardware reconfiguration in order to achieve the system survival. In this paper, a concurrent approach for error localisation in digital neural networks is discussed and evaluated. Two techniques are applied: concurrent diagnosis with the use of data coding for error detection at neuron level and on-line localisation of the faulty neuron within the network.