G. Pandian, Gopala Krishnan Ramaswami, M. Hodkiewicz, E. Cripps, M. Pecht
{"title":"无铅电子系统的长期可靠性","authors":"G. Pandian, Gopala Krishnan Ramaswami, M. Hodkiewicz, E. Cripps, M. Pecht","doi":"10.1109/IPFA.2016.7564306","DOIUrl":null,"url":null,"abstract":"Industries that have been excluded from being required to transition to lead-free electronics (based on RoHs legislation) are nevertheless under economic pressure to transition. However, they are hesitant due to the unavailability of long-term reliability data. This study investigates degradation mechanisms of lead-free electronics systems that were used or stored for 10 years in laboratory conditions. A series of system diagnosis were conducted to evaluate the overall functional health of these computer systems. Accelerated life-time model from the literature was used to estimate the lifetime of the systems using their operating conditions input. These results were compared with current functionality status of the systems.","PeriodicalId":206237,"journal":{"name":"2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)","volume":"58 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Long-term reliability of lead-free electronic systems\",\"authors\":\"G. Pandian, Gopala Krishnan Ramaswami, M. Hodkiewicz, E. Cripps, M. Pecht\",\"doi\":\"10.1109/IPFA.2016.7564306\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Industries that have been excluded from being required to transition to lead-free electronics (based on RoHs legislation) are nevertheless under economic pressure to transition. However, they are hesitant due to the unavailability of long-term reliability data. This study investigates degradation mechanisms of lead-free electronics systems that were used or stored for 10 years in laboratory conditions. A series of system diagnosis were conducted to evaluate the overall functional health of these computer systems. Accelerated life-time model from the literature was used to estimate the lifetime of the systems using their operating conditions input. These results were compared with current functionality status of the systems.\",\"PeriodicalId\":206237,\"journal\":{\"name\":\"2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)\",\"volume\":\"58 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-07-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IPFA.2016.7564306\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IPFA.2016.7564306","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Long-term reliability of lead-free electronic systems
Industries that have been excluded from being required to transition to lead-free electronics (based on RoHs legislation) are nevertheless under economic pressure to transition. However, they are hesitant due to the unavailability of long-term reliability data. This study investigates degradation mechanisms of lead-free electronics systems that were used or stored for 10 years in laboratory conditions. A series of system diagnosis were conducted to evaluate the overall functional health of these computer systems. Accelerated life-time model from the literature was used to estimate the lifetime of the systems using their operating conditions input. These results were compared with current functionality status of the systems.