无铅电子系统的长期可靠性

G. Pandian, Gopala Krishnan Ramaswami, M. Hodkiewicz, E. Cripps, M. Pecht
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引用次数: 0

摘要

尽管如此,那些被排除在向无铅电子产品过渡(基于RoHs立法)的行业仍面临着过渡的经济压力。然而,由于无法获得长期可靠性数据,他们犹豫不决。本研究调查了在实验室条件下使用或储存10年的无铅电子系统的降解机制。进行了一系列系统诊断,以评估这些计算机系统的整体功能健康状况。使用文献中的加速寿命模型根据系统的运行条件输入来估计系统的寿命。这些结果与系统的当前功能状态进行了比较。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Long-term reliability of lead-free electronic systems
Industries that have been excluded from being required to transition to lead-free electronics (based on RoHs legislation) are nevertheless under economic pressure to transition. However, they are hesitant due to the unavailability of long-term reliability data. This study investigates degradation mechanisms of lead-free electronics systems that were used or stored for 10 years in laboratory conditions. A series of system diagnosis were conducted to evaluate the overall functional health of these computer systems. Accelerated life-time model from the literature was used to estimate the lifetime of the systems using their operating conditions input. These results were compared with current functionality status of the systems.
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