MicroBlaze处理器Xilinx嵌入式ECC的设计与测试

2016 IEEE Radiation Effects Data Workshop (REDW) Pub Date : 2016-07-28 DOI:10.1109/NSREC.2016.7891709

Z. Baker, H. Quinn

{"title":"MicroBlaze处理器Xilinx嵌入式ECC的设计与测试","authors":"Z. Baker, H. Quinn","doi":"10.1109/NSREC.2016.7891709","DOIUrl":null,"url":null,"abstract":"The Xilinx Virtex-5QV is robust to configuration errors, but will experience Block RAM upsets. Various approaches to scrubbing Block RAM to support the Xilinx MicroBlaze soft processor were tested at LANSCE. Use of the embedded ECC blocks for system memory is contrasted with soft ECC blocks.","PeriodicalId":135325,"journal":{"name":"2016 IEEE Radiation Effects Data Workshop (REDW)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-07-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Design and Test of Xilinx Embedded ECC for MicroBlaze Processors\",\"authors\":\"Z. Baker, H. Quinn\",\"doi\":\"10.1109/NSREC.2016.7891709\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The Xilinx Virtex-5QV is robust to configuration errors, but will experience Block RAM upsets. Various approaches to scrubbing Block RAM to support the Xilinx MicroBlaze soft processor were tested at LANSCE. Use of the embedded ECC blocks for system memory is contrasted with soft ECC blocks.\",\"PeriodicalId\":135325,\"journal\":{\"name\":\"2016 IEEE Radiation Effects Data Workshop (REDW)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-07-28\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 IEEE Radiation Effects Data Workshop (REDW)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/NSREC.2016.7891709\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE Radiation Effects Data Workshop (REDW)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NSREC.2016.7891709","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 3

摘要

Xilinx Virtex-5QV对配置错误具有很强的稳健性，但会遇到块RAM故障。为了支持Xilinx MicroBlaze软处理器，LANSCE测试了各种清洗Block RAM的方法。使用嵌入式ECC块作为系统内存与软ECC块形成对比。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

Design and Test of Xilinx Embedded ECC for MicroBlaze Processors

The Xilinx Virtex-5QV is robust to configuration errors, but will experience Block RAM upsets. Various approaches to scrubbing Block RAM to support the Xilinx MicroBlaze soft processor were tested at LANSCE. Use of the embedded ECC blocks for system memory is contrasted with soft ECC blocks.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

2016 IEEE Radiation Effects Data Workshop (REDW)

自引率

0.00%

发文量