Y. G. Yoon, J. Hyung, U. H. Jeong, S. Chan, J. Jang
{"title":"售后服务数据分析自镇流器LED灯的损耗失效模式及机理","authors":"Y. G. Yoon, J. Hyung, U. H. Jeong, S. Chan, J. Jang","doi":"10.1109/IPFA.2016.7564277","DOIUrl":null,"url":null,"abstract":"High reliability and long life of self-ballasted LED lamps are a very important lighting source used our in daily life. So we have studied the Wear-out failure modes and reproduced it in a short time by using an accelerated operational life test.","PeriodicalId":206237,"journal":{"name":"2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-07-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Wear-out failure modes and mechanism analysis of self-ballasted LED lamps via after-sale service data\",\"authors\":\"Y. G. Yoon, J. Hyung, U. H. Jeong, S. Chan, J. Jang\",\"doi\":\"10.1109/IPFA.2016.7564277\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"High reliability and long life of self-ballasted LED lamps are a very important lighting source used our in daily life. So we have studied the Wear-out failure modes and reproduced it in a short time by using an accelerated operational life test.\",\"PeriodicalId\":206237,\"journal\":{\"name\":\"2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-07-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IPFA.2016.7564277\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IPFA.2016.7564277","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Wear-out failure modes and mechanism analysis of self-ballasted LED lamps via after-sale service data
High reliability and long life of self-ballasted LED lamps are a very important lighting source used our in daily life. So we have studied the Wear-out failure modes and reproduced it in a short time by using an accelerated operational life test.