{"title":"电连接器用覆层金属嵌体的可靠性","authors":"F. Lee","doi":"10.1109/TPHP.1977.1135171","DOIUrl":null,"url":null,"abstract":"Following the prior publication [ 1 ], we tested more connector hardware of clad metal inlays the quality of which is quite close to the production level. In other words, the spring base material was all made of beryllium copper fully heat-treated after forming. The springs were punched and formed with a production the spring gaps were more uniform and all within the specified range, though in the high end. The inlay materials used in this extended test were: a) 18K Au (75Au25Ag), b) pure palladium (100 Pd), c) Alloy 69Au25Ag6Pt, d) 60Pd40Ag alloy, and e) alloy-55(55Au39Ag3Cd31n). These materials were reported to have relatively better performance among the many candidates we initially studied. The sample size used in these tests was much larger than the previous one; as a result, the experimental data are more reliable and meaningful. Two groups of connector hardware representing today's highdensity miniature electronic packaging were used. One group was the cylinder-cylinder contact, the other was the cylinder-flat contact. Also some discussion was devoted to the dimple-flat contact system. The contact-resistance data were collected over a period of 6 months to 1 year from three kinds of environmental tests. Both porosity and formability were acceptable for all the inlay springs. No wear-through contacts were found after 50 insertions with lubricant applied on the Au or Pd plated pins. All five inlay materials tested behaved almost equally well in their contact-resistance measurements. Previously the 69Au25Ag6Pt was chosen as the best, and the palladium stood as the second best at that time. However, in this paper we have shown that the Pd is clearly the winner in many aspects of the tests. The 69Au25Ag6Pt is equivalent to the 75Au25Ag alloy as the second best choice.","PeriodicalId":387212,"journal":{"name":"IEEE Transactions on Parts, Hybrids, and Packaging","volume":"17 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1977-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Reliability of Clad Metal Inlays for Electrical Connectors\",\"authors\":\"F. Lee\",\"doi\":\"10.1109/TPHP.1977.1135171\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Following the prior publication [ 1 ], we tested more connector hardware of clad metal inlays the quality of which is quite close to the production level. In other words, the spring base material was all made of beryllium copper fully heat-treated after forming. The springs were punched and formed with a production the spring gaps were more uniform and all within the specified range, though in the high end. The inlay materials used in this extended test were: a) 18K Au (75Au25Ag), b) pure palladium (100 Pd), c) Alloy 69Au25Ag6Pt, d) 60Pd40Ag alloy, and e) alloy-55(55Au39Ag3Cd31n). These materials were reported to have relatively better performance among the many candidates we initially studied. The sample size used in these tests was much larger than the previous one; as a result, the experimental data are more reliable and meaningful. Two groups of connector hardware representing today's highdensity miniature electronic packaging were used. One group was the cylinder-cylinder contact, the other was the cylinder-flat contact. Also some discussion was devoted to the dimple-flat contact system. The contact-resistance data were collected over a period of 6 months to 1 year from three kinds of environmental tests. Both porosity and formability were acceptable for all the inlay springs. No wear-through contacts were found after 50 insertions with lubricant applied on the Au or Pd plated pins. All five inlay materials tested behaved almost equally well in their contact-resistance measurements. Previously the 69Au25Ag6Pt was chosen as the best, and the palladium stood as the second best at that time. However, in this paper we have shown that the Pd is clearly the winner in many aspects of the tests. 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引用次数: 5
摘要
在先前的出版物[1]之后,我们测试了更多的覆层金属镶嵌的连接器硬件,其质量非常接近生产水平。换句话说,弹簧基体材料全部由铍铜制成,成型后经过充分热处理。弹簧冲孔成形与生产弹簧间隙更均匀,所有在规定的范围内,虽然在高端。扩展试验中使用的镶嵌材料为:a) 18K Au (75Au25Ag), b)纯钯(100pd), c) Alloy 69Au25Ag6Pt, d) 60Pd40Ag Alloy, e) Alloy -55(55Au39Ag3Cd31n)。据报道,在我们最初研究的许多候选材料中,这些材料的性能相对较好。这次试验的样本量比上一次大得多;因此,实验数据更加可靠和有意义。使用了代表当今高密度微型电子封装的两组连接器硬件。一组是圆柱体-圆柱体接触,另一组是圆柱体-平面接触。此外,本文还对凹凹平面接触系统作了一些讨论。接触电阻数据是在6个月到1年的时间里从三种环境试验中收集的。所有镶嵌弹簧的孔隙率和成形性均可接受。在镀金或镀钯引脚上涂抹润滑油50次后,没有发现磨损接触。所有测试的五种镶嵌材料在接触电阻测量中表现得几乎一样好。在此之前,69Au25Ag6Pt被选为最好的,钯在当时排名第二。然而,在本文中,我们已经表明,在测试的许多方面,Pd显然是赢家。69Au25Ag6Pt合金相当于75Au25Ag合金,是第二佳选择。
Reliability of Clad Metal Inlays for Electrical Connectors
Following the prior publication [ 1 ], we tested more connector hardware of clad metal inlays the quality of which is quite close to the production level. In other words, the spring base material was all made of beryllium copper fully heat-treated after forming. The springs were punched and formed with a production the spring gaps were more uniform and all within the specified range, though in the high end. The inlay materials used in this extended test were: a) 18K Au (75Au25Ag), b) pure palladium (100 Pd), c) Alloy 69Au25Ag6Pt, d) 60Pd40Ag alloy, and e) alloy-55(55Au39Ag3Cd31n). These materials were reported to have relatively better performance among the many candidates we initially studied. The sample size used in these tests was much larger than the previous one; as a result, the experimental data are more reliable and meaningful. Two groups of connector hardware representing today's highdensity miniature electronic packaging were used. One group was the cylinder-cylinder contact, the other was the cylinder-flat contact. Also some discussion was devoted to the dimple-flat contact system. The contact-resistance data were collected over a period of 6 months to 1 year from three kinds of environmental tests. Both porosity and formability were acceptable for all the inlay springs. No wear-through contacts were found after 50 insertions with lubricant applied on the Au or Pd plated pins. All five inlay materials tested behaved almost equally well in their contact-resistance measurements. Previously the 69Au25Ag6Pt was chosen as the best, and the palladium stood as the second best at that time. However, in this paper we have shown that the Pd is clearly the winner in many aspects of the tests. The 69Au25Ag6Pt is equivalent to the 75Au25Ag alloy as the second best choice.