RAM BIST的无混叠签名分析

Proceedings., International Test Conference Pub Date : 1994-10-02 DOI:10.1109/TEST.1994.527978

V. Yarmolik, M. Nicolaidis, O. Kebichi

{"title":"RAM BIST的无混叠签名分析","authors":"V. Yarmolik, M. Nicolaidis, O. Kebichi","doi":"10.1109/TEST.1994.527978","DOIUrl":null,"url":null,"abstract":"Signature analyzers are very efficient output response compactors in BIST techniques. The only limitation of signature analysis is the fault coverage reduction (aliasing) due to the information loss inherent to any data compaction. In this paper, in order to increase the effectiveness of RAM BIST, we fake advantage from the regularity of the RAM test algorithms and we show that aliasing-free signature analysis can be achieved in RAM BIST.","PeriodicalId":309921,"journal":{"name":"Proceedings., International Test Conference","volume":"48 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":"{\"title\":\"Aliasing-free signature analysis for RAM BIST\",\"authors\":\"V. Yarmolik, M. Nicolaidis, O. Kebichi\",\"doi\":\"10.1109/TEST.1994.527978\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Signature analyzers are very efficient output response compactors in BIST techniques. The only limitation of signature analysis is the fault coverage reduction (aliasing) due to the information loss inherent to any data compaction. In this paper, in order to increase the effectiveness of RAM BIST, we fake advantage from the regularity of the RAM test algorithms and we show that aliasing-free signature analysis can be achieved in RAM BIST.\",\"PeriodicalId\":309921,\"journal\":{\"name\":\"Proceedings., International Test Conference\",\"volume\":\"48 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1994-10-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"7\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings., International Test Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TEST.1994.527978\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings., International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.1994.527978","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 7

摘要

特征分析仪是BIST技术中非常有效的输出响应压缩器。签名分析的唯一限制是由于任何数据压缩所固有的信息丢失而导致的故障覆盖减少(混叠)。为了提高RAM测试算法的有效性，我们利用RAM测试算法的规律性，证明了在RAM测试算法中可以实现无混叠的签名分析。

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Aliasing-free signature analysis for RAM BIST

Signature analyzers are very efficient output response compactors in BIST techniques. The only limitation of signature analysis is the fault coverage reduction (aliasing) due to the information loss inherent to any data compaction. In this paper, in order to increase the effectiveness of RAM BIST, we fake advantage from the regularity of the RAM test algorithms and we show that aliasing-free signature analysis can be achieved in RAM BIST.

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Proceedings., International Test Conference

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