直流溅射氧化锡薄膜的热处理

A. Sabnis, L. Feisel
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引用次数: 8

摘要

采用压缩粉末靶,采用直流辉光放电溅射法制备了二氧化锡薄膜。这些薄膜的电导率从3 × 10-5 \Omega -1cm-1(纯sno2)到1 \Omega -1cm-1(添加9%的sb2o3到目标)不等。透明度在85%以上。由于晶格无序,从含有超过10% sb2o3的靶上溅射的薄膜具有高电阻性。然而,这种薄膜在沉积后热处理后变得导电。本文介绍了对这些掺杂锑的二氧化锡薄膜进行热处理的结果。发现电阻率随温度的变化是非常复杂的。它不仅取决于以前的热处理历史,而且还取决于沉积过程中使用的环境溅射气体。加热超过400°C导致SnO 2薄膜的电导率普遍下降。低于这个温度,在氮气中连续加热和冷却可以提高导电性和稳定性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Heat Treatment of Dc-Sputtered Tin Dioxide Thin Films
Tin dioxide thin films were deposited by dc glow discharge sputtering using a compressed powder target. The conductivity of these films varied from 3 X 10-5 \Omega -1cm-1for pure SnO 2 to 1 \Omega -1cm-1for SnO 2 which was doped by adding 9 percent Sb 2 O 3 to the target. Transparency was above 85 percent. Films sputtered from targets containing more than 10 percent Sb 2 O 3 were highly resistive as a result of lattice disorder. Such films, however, became conductive upon post-deposition heat treatment. This paper presents the results of the heat treatment of these antimony-doped tin dioxide films. The variation of resistivity with temperature was found to be very complex. It not only depends on the previous heat-treatment history but also on the ambient sputter gas used during deposition. Heating beyond 400°C resulted in a general decrease in the conductivity of SnO 2 films. Below this temperature, successive heating and cooling in nitrogen caused increased conductivity and improved stability.
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