J. Henkel, O. Bringmann, A. Herkersdorf, W. Rosenstiel, N. Wehn
{"title":"可靠的嵌入式系统:德国研究基金会DFG优先计划spp1500","authors":"J. Henkel, O. Bringmann, A. Herkersdorf, W. Rosenstiel, N. Wehn","doi":"10.1109/ETS.2012.6233053","DOIUrl":null,"url":null,"abstract":"When migrating to future technology nodes, dependability becomes a major design problem as variability, aging and susceptibility to soft errors increase. The purpose of this program is to research cross-layer solutions that address the physical problems at system-level i.e. at hardware-level, operating system level, application level etc. The goals and an overview of the DFG SPP 1500 research program are presented.","PeriodicalId":429839,"journal":{"name":"2012 17th IEEE European Test Symposium (ETS)","volume":"7 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-05-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Dependable embedded systems: The German research foundation DFG priority program SPP 1500\",\"authors\":\"J. Henkel, O. Bringmann, A. Herkersdorf, W. Rosenstiel, N. Wehn\",\"doi\":\"10.1109/ETS.2012.6233053\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"When migrating to future technology nodes, dependability becomes a major design problem as variability, aging and susceptibility to soft errors increase. The purpose of this program is to research cross-layer solutions that address the physical problems at system-level i.e. at hardware-level, operating system level, application level etc. The goals and an overview of the DFG SPP 1500 research program are presented.\",\"PeriodicalId\":429839,\"journal\":{\"name\":\"2012 17th IEEE European Test Symposium (ETS)\",\"volume\":\"7 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-05-28\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2012 17th IEEE European Test Symposium (ETS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ETS.2012.6233053\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 17th IEEE European Test Symposium (ETS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ETS.2012.6233053","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Dependable embedded systems: The German research foundation DFG priority program SPP 1500
When migrating to future technology nodes, dependability becomes a major design problem as variability, aging and susceptibility to soft errors increase. The purpose of this program is to research cross-layer solutions that address the physical problems at system-level i.e. at hardware-level, operating system level, application level etc. The goals and an overview of the DFG SPP 1500 research program are presented.