Spectral RTL Test Generation for Gate-Level Stuck-at Faults

We model RTL faults as stuck-at faults on primary inputs, primary outputs, and flip-flops. Tests for these faults are analyzed using Hadamard matrices for Walsh functions and random noise level at each primary input. This information then helps generate vector sequences. At the gate-level, a fault simulator and an integer linear program (ILP) compact the test sequences. We give results for four ITC'99 and four ISC AS'89 benchmark circuits, and an experimental processor. The RTL spectral vectors performed equally well on multiple gate-level implementations. Compared to a gate-level ATPG, RTL vectors produced similar or higher coverage in shorter CPU times