喷墨印刷薄膜的希腊十字测试结构

2013 IEEE International Conference on Microelectronic Test Structures (ICMTS) Pub Date : 2013-03-25 DOI:10.1109/ICMTS.2013.6528166

E. Díaz, E. Ramón, J. Carrabina

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引用次数: 3

摘要

本文报道了使用希腊十字测试结构来表征喷墨印刷电子电路的几何形状。从光学表征中提取的几何特征可以与平方电阻的电测量相关联，以加快表征过程。喷墨印刷希腊十字测试结构的设计应考虑油墨聚结和咖啡环效应。

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Greek cross test structure for inkjet printed thin films

This paper reports on usage of Greek cross test structure to characterize geometry of inkjet printed electronics circuits. Geometric characteristics extracted from optical characterization can be correlated with electric measurements for square resistance in order to speed up the characterization processes. Design of inkjet printed Greek cross test structure should consider the ink coalescence and coffee ring effects.

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2013 IEEE International Conference on Microelectronic Test Structures (ICMTS)

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