中间层封装上高速CSP SRAM的可制造性和可靠性

K. Liu, J. Priest, J. Xue, Jarsh Lin, C. Kao, T. Wang, Y. Lai
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引用次数: 1

摘要

本文讨论了安装在中间层上的定制CSP SRAM的可制造性和可靠性。为了为高可靠性应用提供可靠的器件,设计了一种SRAM中间层结构,以确保每一级焊点互连的高可靠性。以有限元建模方法为手段,对各种保护方法配置的可靠性进行了评估。建立了测试车辆,对从有限元模拟中选择的配置进行可靠性测试,以评估SRAM中介器的完整性和鲁棒性。在实际生产中,考虑到欠充填料的可靠性,选择了欠充填料作为保护方法。然而,为了解决可制造性问题,在生产过程中需要额外的努力来实施。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Manufacturability and reliability of a high-speed CSP SRAM on an interposer package
Manufacturability and reliability of a custom CSP SRAM mounted on an interposer is discussed in this paper. In order to provide a reliable device for high reliability applications, an SRAM interposer structure was designed to ensure high reliability on every level of solder joint interconnects. Finite element modeling method was used as a mean to evaluate the reliability of various configurations of the protection methods. Test vehicles were built to run reliability tests on selected configurations from FEA simulation to evaluate the integrity and robustness of the SRAM interposer. An under fill process was chosen to be the protection method in production because of its reliability performance. However, extra efforts are needed for implementation during production in order to address the manufacturability concern.
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