纳米技术中的IDDQ测试挑战:制造测试策略

16th Asian Test Symposium (ATS 2007) Pub Date : 2007-10-08 DOI:10.1109/ATS.2007.36

Yu Wei P'ng, Moo Kit Lee, P. W. Ng, Chin Hu Ong

{"title":"纳米技术中的IDDQ测试挑战:制造测试策略","authors":"Yu Wei P'ng, Moo Kit Lee, P. W. Ng, Chin Hu Ong","doi":"10.1109/ATS.2007.36","DOIUrl":null,"url":null,"abstract":"The implementation of IDDQ test is increasingly challenging with the shrinking of process geometry in nanotechnologies. This paper presents a case study of the test challenges that the industry is facing in deep submicron process. An IDDQ manufacturing test strategy is discussed to address the challenges.","PeriodicalId":289969,"journal":{"name":"16th Asian Test Symposium (ATS 2007)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-10-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"IDDQ Test Challenges in Nanotechnologies: A Manufacturing Test Strategy\",\"authors\":\"Yu Wei P'ng, Moo Kit Lee, P. W. Ng, Chin Hu Ong\",\"doi\":\"10.1109/ATS.2007.36\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The implementation of IDDQ test is increasingly challenging with the shrinking of process geometry in nanotechnologies. This paper presents a case study of the test challenges that the industry is facing in deep submicron process. An IDDQ manufacturing test strategy is discussed to address the challenges.\",\"PeriodicalId\":289969,\"journal\":{\"name\":\"16th Asian Test Symposium (ATS 2007)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-10-08\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"16th Asian Test Symposium (ATS 2007)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ATS.2007.36\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"16th Asian Test Symposium (ATS 2007)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS.2007.36","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 4

摘要

随着纳米技术中工艺几何尺寸的不断缩小，IDDQ测试的实施越来越具有挑战性。本文介绍了深亚微米工艺在测试中面临的挑战。讨论了IDDQ制造测试策略来解决这些挑战。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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IDDQ Test Challenges in Nanotechnologies: A Manufacturing Test Strategy

The implementation of IDDQ test is increasingly challenging with the shrinking of process geometry in nanotechnologies. This paper presents a case study of the test challenges that the industry is facing in deep submicron process. An IDDQ manufacturing test strategy is discussed to address the challenges.

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来源期刊

16th Asian Test Symposium (ATS 2007)

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