掐断效应对非均匀肖特基二极管I-V曲线的影响

J. Osvald
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引用次数: 0

摘要

用泊松方程和漂移扩散方程模拟了非均匀肖特基二极管的I-V和C-V特性。结果表明,I-V和C-V曲线以及提取的表观肖特基二极管参数仅轻微依赖于较大尺寸的单势垒斑块之间的横向相关性。通过大尺寸和纳米尺寸非均匀性二极管的电流之间的差异非常小。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Influence of the pinch-off effect on I-V curves of inhomogeneous Schottky diodes
The Poisson equation together with the drift-diffusion equations have been used to simulate both I-V and C-V characteristic of inhomogeneous Schottky diodes. It is shown that the I-V and C-V curves and extracted apparent Schottky diode parameters depend only slightly if at all, on a lateral correlation between the single barrier patches for larger dimension of patches. Very small differences were found between the currents flowing through the diode with large and nanosize inhomogeneities.
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