提高封装和板级可靠性的触摸芯片设计分析

T. Y. Tee, H. Ng, H. Siegel, R. Bond, Z. Zhong
{"title":"提高封装和板级可靠性的触摸芯片设计分析","authors":"T. Y. Tee, H. Ng, H. Siegel, R. Bond, Z. Zhong","doi":"10.1109/EPTC.2004.1396706","DOIUrl":null,"url":null,"abstract":"Touch chip, a unique bio-sensor to recognize fingerprint of users, is ideally suited for portable consumer applications such as mobile phones, remote controls, tablet PCs, PDAs, and ultra-thin laptop computers as security system. Modeling is a useful and efficient tool for design analysis. In this paper, both package and board level modeling are performed for touch strip, a new generation of touch chip design. The fatigue life, failure location and crack interface of the critical solder ball during thermal cycling test are predicted. It covers 14 design parameters for solder joint reliability analysis, i.e. die size and thickness, substrate thickness, board thickness, mold compound thickness, solder ball geometry, die attach and mold compound material properties, inclusion of polyimide layer, and temperature cycling range. Package level stress analysis is investigated for polyimide thickness and modulus. The findings help to design a more reliable touch chip at both package and board levels.","PeriodicalId":370907,"journal":{"name":"Proceedings of 6th Electronics Packaging Technology Conference (EPTC 2004) (IEEE Cat. No.04EX971)","volume":"121 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-12-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Design analysis of touch chip for enhanced package and board level reliability\",\"authors\":\"T. Y. Tee, H. Ng, H. Siegel, R. Bond, Z. Zhong\",\"doi\":\"10.1109/EPTC.2004.1396706\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Touch chip, a unique bio-sensor to recognize fingerprint of users, is ideally suited for portable consumer applications such as mobile phones, remote controls, tablet PCs, PDAs, and ultra-thin laptop computers as security system. Modeling is a useful and efficient tool for design analysis. In this paper, both package and board level modeling are performed for touch strip, a new generation of touch chip design. The fatigue life, failure location and crack interface of the critical solder ball during thermal cycling test are predicted. It covers 14 design parameters for solder joint reliability analysis, i.e. die size and thickness, substrate thickness, board thickness, mold compound thickness, solder ball geometry, die attach and mold compound material properties, inclusion of polyimide layer, and temperature cycling range. Package level stress analysis is investigated for polyimide thickness and modulus. The findings help to design a more reliable touch chip at both package and board levels.\",\"PeriodicalId\":370907,\"journal\":{\"name\":\"Proceedings of 6th Electronics Packaging Technology Conference (EPTC 2004) (IEEE Cat. No.04EX971)\",\"volume\":\"121 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2004-12-08\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of 6th Electronics Packaging Technology Conference (EPTC 2004) (IEEE Cat. No.04EX971)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EPTC.2004.1396706\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of 6th Electronics Packaging Technology Conference (EPTC 2004) (IEEE Cat. No.04EX971)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPTC.2004.1396706","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4

摘要

触摸芯片是一种独特的生物传感器,可以识别用户的指纹,非常适合便携式消费应用,如手机,遥控器,平板电脑,pda和超薄笔记本电脑作为安全系统。建模是设计分析的有效工具。本文对新一代触摸芯片——触摸条的设计进行了封装级和板级的建模。对临界焊球在热循环试验中的疲劳寿命、失效位置和裂纹界面进行了预测。它涵盖了用于焊点可靠性分析的14个设计参数,即模具尺寸和厚度、衬底厚度、板厚度、模具复合材料厚度、焊锡球几何形状、模具附件和模具复合材料性能、包含聚酰亚胺层和温度循环范围。对聚酰亚胺的厚度和模量进行了包层应力分析。这些发现有助于在封装和板级设计更可靠的触摸芯片。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Design analysis of touch chip for enhanced package and board level reliability
Touch chip, a unique bio-sensor to recognize fingerprint of users, is ideally suited for portable consumer applications such as mobile phones, remote controls, tablet PCs, PDAs, and ultra-thin laptop computers as security system. Modeling is a useful and efficient tool for design analysis. In this paper, both package and board level modeling are performed for touch strip, a new generation of touch chip design. The fatigue life, failure location and crack interface of the critical solder ball during thermal cycling test are predicted. It covers 14 design parameters for solder joint reliability analysis, i.e. die size and thickness, substrate thickness, board thickness, mold compound thickness, solder ball geometry, die attach and mold compound material properties, inclusion of polyimide layer, and temperature cycling range. Package level stress analysis is investigated for polyimide thickness and modulus. The findings help to design a more reliable touch chip at both package and board levels.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信