K. Okamoto, M. Tada, N. Banno, N. Iguchi, H. Hada, T. Sakamoto, M. Miyamura, Y. Tsuji, R. Nebashi, A. Morioka, X. Bai, T. Sugibayashi
{"title":"坚固的铜原子开关,具有超过400°C的耐热聚合物固体电解质(TT-PSE),用于非易失性可编程逻辑","authors":"K. Okamoto, M. Tada, N. Banno, N. Iguchi, H. Hada, T. Sakamoto, M. Miyamura, Y. Tsuji, R. Nebashi, A. Morioka, X. Bai, T. Sugibayashi","doi":"10.1109/VLSIT.2016.7573403","DOIUrl":null,"url":null,"abstract":"A fully 400°C-processed, standard Cu-BEOL compatible, robust Cu atom switch has been developed featuring an over-400°C high thermally tolerant polymer-solid electrolyte (TT-PSE). Hydrocarbons that have weak chemical bindings in the PSE are selectively eliminated in the TT-PSE, resulting in higher thermal stability. The TT-PSE also gives higher breakdown voltage (+1V) with keeping low set voltage (2V) due to the elimination of the fragile hydrocarbon bindings. Data retention characteristics after thermal cycle stress at temperature ranging from -65 to 150°C for 1000 cycles are confirmed for the first time. The developed atom switch is to be a technology enabler of reliable reprogrammable logics for future robotic/vehicle applications at high temperatures.","PeriodicalId":129300,"journal":{"name":"2016 IEEE Symposium on VLSI Technology","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-06-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Robust Cu atom switch with over-400°C thermally tolerant polymer-solid electrolyte (TT-PSE) for nonvolatile programmable logic\",\"authors\":\"K. Okamoto, M. Tada, N. Banno, N. Iguchi, H. Hada, T. Sakamoto, M. Miyamura, Y. Tsuji, R. Nebashi, A. Morioka, X. Bai, T. Sugibayashi\",\"doi\":\"10.1109/VLSIT.2016.7573403\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A fully 400°C-processed, standard Cu-BEOL compatible, robust Cu atom switch has been developed featuring an over-400°C high thermally tolerant polymer-solid electrolyte (TT-PSE). Hydrocarbons that have weak chemical bindings in the PSE are selectively eliminated in the TT-PSE, resulting in higher thermal stability. The TT-PSE also gives higher breakdown voltage (+1V) with keeping low set voltage (2V) due to the elimination of the fragile hydrocarbon bindings. Data retention characteristics after thermal cycle stress at temperature ranging from -65 to 150°C for 1000 cycles are confirmed for the first time. The developed atom switch is to be a technology enabler of reliable reprogrammable logics for future robotic/vehicle applications at high temperatures.\",\"PeriodicalId\":129300,\"journal\":{\"name\":\"2016 IEEE Symposium on VLSI Technology\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-06-14\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 IEEE Symposium on VLSI Technology\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VLSIT.2016.7573403\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE Symposium on VLSI Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VLSIT.2016.7573403","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Robust Cu atom switch with over-400°C thermally tolerant polymer-solid electrolyte (TT-PSE) for nonvolatile programmable logic
A fully 400°C-processed, standard Cu-BEOL compatible, robust Cu atom switch has been developed featuring an over-400°C high thermally tolerant polymer-solid electrolyte (TT-PSE). Hydrocarbons that have weak chemical bindings in the PSE are selectively eliminated in the TT-PSE, resulting in higher thermal stability. The TT-PSE also gives higher breakdown voltage (+1V) with keeping low set voltage (2V) due to the elimination of the fragile hydrocarbon bindings. Data retention characteristics after thermal cycle stress at temperature ranging from -65 to 150°C for 1000 cycles are confirmed for the first time. The developed atom switch is to be a technology enabler of reliable reprogrammable logics for future robotic/vehicle applications at high temperatures.