坚固的铜原子开关,具有超过400°C的耐热聚合物固体电解质(TT-PSE),用于非易失性可编程逻辑

K. Okamoto, M. Tada, N. Banno, N. Iguchi, H. Hada, T. Sakamoto, M. Miyamura, Y. Tsuji, R. Nebashi, A. Morioka, X. Bai, T. Sugibayashi
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引用次数: 3

摘要

一种完全400°C处理,标准Cu- beol兼容,坚固的Cu原子开关已经开发出超过400°C的高耐热聚合物固体电解质(TT-PSE)。在PSE中具有弱化学结合的碳氢化合物在TT-PSE中被选择性地消除,从而获得更高的热稳定性。TT-PSE还可以提供更高的击穿电压(+1V),并保持较低的设定电压(2V),因为它消除了易碎的碳氢化合物结合。首次确认了在-65 ~ 150℃温度下1000次热循环应力后的数据保留特性。开发的原子开关将成为未来高温下机器人/车辆应用可靠的可重新编程逻辑的技术推手。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Robust Cu atom switch with over-400°C thermally tolerant polymer-solid electrolyte (TT-PSE) for nonvolatile programmable logic
A fully 400°C-processed, standard Cu-BEOL compatible, robust Cu atom switch has been developed featuring an over-400°C high thermally tolerant polymer-solid electrolyte (TT-PSE). Hydrocarbons that have weak chemical bindings in the PSE are selectively eliminated in the TT-PSE, resulting in higher thermal stability. The TT-PSE also gives higher breakdown voltage (+1V) with keeping low set voltage (2V) due to the elimination of the fragile hydrocarbon bindings. Data retention characteristics after thermal cycle stress at temperature ranging from -65 to 150°C for 1000 cycles are confirmed for the first time. The developed atom switch is to be a technology enabler of reliable reprogrammable logics for future robotic/vehicle applications at high temperatures.
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