{"title":"不测量截止频率的异质结双极晶体管基极传输时间的直接测定","authors":"Seonghearn Lee","doi":"10.1109/ICMTS.1995.513957","DOIUrl":null,"url":null,"abstract":"An accurate extraction method, based on a simple Z parameter equation at low frequencies, is developed to determine the base transit time of heterojunction bipolar transistors without cutoff frequency measurement that may suffer an inaccuracy. This new technique has much smaller uncertainty than the previous cutoff frequency method, because the determination of collector charging time is not needed to extract the base transit time using this method.","PeriodicalId":432935,"journal":{"name":"Proceedings International Conference on Microelectronic Test Structures","volume":"33 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1995-03-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Direct determination of base transit time for heterojunction bipolar transistors without cutoff frequency measurement\",\"authors\":\"Seonghearn Lee\",\"doi\":\"10.1109/ICMTS.1995.513957\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"An accurate extraction method, based on a simple Z parameter equation at low frequencies, is developed to determine the base transit time of heterojunction bipolar transistors without cutoff frequency measurement that may suffer an inaccuracy. This new technique has much smaller uncertainty than the previous cutoff frequency method, because the determination of collector charging time is not needed to extract the base transit time using this method.\",\"PeriodicalId\":432935,\"journal\":{\"name\":\"Proceedings International Conference on Microelectronic Test Structures\",\"volume\":\"33 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1995-03-22\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings International Conference on Microelectronic Test Structures\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICMTS.1995.513957\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings International Conference on Microelectronic Test Structures","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICMTS.1995.513957","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Direct determination of base transit time for heterojunction bipolar transistors without cutoff frequency measurement
An accurate extraction method, based on a simple Z parameter equation at low frequencies, is developed to determine the base transit time of heterojunction bipolar transistors without cutoff frequency measurement that may suffer an inaccuracy. This new technique has much smaller uncertainty than the previous cutoff frequency method, because the determination of collector charging time is not needed to extract the base transit time using this method.