多门控器件体系结构的进步、优势和挑战

L. Mathew, Yang Du, A. Thean, M. Sadd, A. Vandooren, C. Parker, T. Stephens, R. Mora, R. Rai, M. Zavala, D. Sing, S. Kalpai, J. Hughes, R. Shimer, S. Jallepalli, G. Workman, B. White, B. Nguyen, A. Mogab
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引用次数: 3

摘要

包含多个栅极结构的器件架构已被提出,以允许晶体管超越平面mcfet集成。这些器件架构可以提高性能,例如更好的短通道性能和减少泄漏。此外,额外的通道表面和栅极提供了新的电路可能性,例如动态阈值电压控制和射频混频器。制造多侧单极和多栅电极的多门控器件是理想的,这已经成功地证明了。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Multi gated device architectures advances, advantages and challenges
Device architectures incorporating multiple gate structures have been proposed to allow transistor scaling beyond the planar MCSFET integrations. These device architectures can improve performance such as better short channel performance and reduced leakage. In addition the additional channel surface and gate electrodes offers new circuit possibilities such as dynamic threshold voltage control and an RF mixer are demonstrated. It is desirable to fabricate multi-gated devices with the single gate on multiple sides and multiple gate electrodes this has been demonstrated successfully.
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