消除铜丝颈疲劳断裂

Song Xiaoqing, Wei Haili, Z. Hong-bin
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引用次数: 1

摘要

本文介绍了在温度循环试验(TC)和间歇使用寿命试验(IOL)后消除铜丝颈疲劳断裂问题所面临的挑战。经TC1000次循环和IOL15000次循环后,检测到合格批号因封装内部应力而破裂;经详细分析横截面样品,新鲜机组未发现异常;但在TC/IOL单元中,Cu晶体沿晶界有细小的裂纹。寻找导致疲劳断裂的关键因素是一个很大的挑战。考虑了环丝长度、环丝类型、环回数据、自由气球尺寸、环丝类型、环丝粒度、毛细尖端角、复合含水率、曲线时间和TC剖面等因素,DOE结果表明,Tg和CTE是影响压裂效果的关键因素。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Cu wire neck fatigue fracturing elimination
This paper present the challenges of elimination on Cu wire neck fatigue fracturing issue after TC (Temperature Cycle) and IOL (Intermittent Operational Life Test). The qualification lots were detected fracturing after TC1000 cycles and IOL15000 cycles due to stress inner of package; after detail analyze the cross section samples, there is no any abnormal was found from fresh unit; but the minor cracks were detected along the grain edge of Cu crystalloid from TC/IOL units. A big challenge is to search out the key factors which are for fatigue fracturing. As presented in this paper, the Wire Looping Length, Looping Type, Loop Reversion Data, Free Air Ball Size, Wire Type, Wire Grain Size, Capillary Tip Angle, Compound Moisture, Curve Time and TC Profile were considered, DOE result indicate Tg & CTE of compound, package type and TC profile is Key factors for fracturing.
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