熔断器接头物理分析方法

Andrew C. Sabate, Norazfar Nordin, Benedict Jimenez
{"title":"熔断器接头物理分析方法","authors":"Andrew C. Sabate, Norazfar Nordin, Benedict Jimenez","doi":"10.1109/IPFA.2016.7564256","DOIUrl":null,"url":null,"abstract":"Fuse trim links failure on analog devices can cause wrong Vref value, incorrect I2C address, incorrect frequency setting, etc. The fuse trim links failure can either be unblown or mistakenly blown during the trimming process. To validate, if blown or unblown, physical analysis is needed to check the trim links. This paper aims to discuss the different physical analysis methodology to check the integrity of trim links.","PeriodicalId":206237,"journal":{"name":"2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-07-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Fuse trim links physical analysis methodology\",\"authors\":\"Andrew C. Sabate, Norazfar Nordin, Benedict Jimenez\",\"doi\":\"10.1109/IPFA.2016.7564256\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Fuse trim links failure on analog devices can cause wrong Vref value, incorrect I2C address, incorrect frequency setting, etc. The fuse trim links failure can either be unblown or mistakenly blown during the trimming process. To validate, if blown or unblown, physical analysis is needed to check the trim links. This paper aims to discuss the different physical analysis methodology to check the integrity of trim links.\",\"PeriodicalId\":206237,\"journal\":{\"name\":\"2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)\",\"volume\":\"2 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-07-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IPFA.2016.7564256\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IPFA.2016.7564256","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

摘要

模拟设备上的熔断器修剪链路故障可能导致错误的Vref值,错误的I2C地址,错误的频率设置等。在修剪过程中,保险丝修剪链接故障可能未被熔断或错误地熔断。为了验证是否吹气或未吹气,需要进行物理分析以检查修剪链接。本文的目的是讨论不同的物理分析方法,以检查整流环节的完整性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Fuse trim links physical analysis methodology
Fuse trim links failure on analog devices can cause wrong Vref value, incorrect I2C address, incorrect frequency setting, etc. The fuse trim links failure can either be unblown or mistakenly blown during the trimming process. To validate, if blown or unblown, physical analysis is needed to check the trim links. This paper aims to discuss the different physical analysis methodology to check the integrity of trim links.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信