基于HTCC技术的宽带低损耗毫米波MMIC封装

Yangfan Zhou, Lin-jie Liu, Zhizhuang Qiao, Ke Wang, Ling Gao
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引用次数: 0

摘要

基于共面波导,设计了一种基于高温共烧陶瓷(HTCC)技术的毫米波单片微波集成电路(MMIC)互连封装方案。通过HFSS软件对传输结构模型进行优化,设计的结构具有极低的回波损耗、插入损耗和宽带宽。这个包装概念已经测量到Ka波段。该封装样品是基于多层高温共烧陶瓷工艺制备的。采用矢量网络分析仪、500μm螺距空气共面探头和配套夹具对封装样品进行了测量。在考虑了测试衬底和焊线的影响后,测得的回波损耗和插入损耗与仿真结果基本一致。在直流至40 GHz的宽频率范围内,插入损耗优于1.2 dB,回波损耗优于13 dB。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A Wideband and Low Loss Millimeter-wave MMIC Packaging Based on HTCC Technology
According to the coplanar waveguide, an interconnection and packaging solution for millimeter-wave monolithic microwave integrated circuit (MMIC) is designed based on high-temperature co-fired ceramic (HTCC) technology. By optimizing the transmission structure model with HFSS software, the designed structure has extraordinarily low return loss, insertion loss and wide bandwidth. This packaging concept has been measured up to the Ka band. The package samples are manufactured based on multilayer high-temperature co-fired ceramic process. The package samples are measured by vector network analyzer, 500μm pitch air coplanar probes and matching fixture. After considering the influence of test substrate and bonding wire, the measured return loss and insertion loss are consistent with simulation result. Over a wide frequency range from DC up to 40 GHz, the insertion loss is better than 1.2 dB and the return loss is better than 13 dB.
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