Ultra hi-speed pin-electronics and test station using GaAs IC

This paper describes the pin-electronics technique applied in a high speed/high pin count test head which targets testing quarter micron high speed CMOS VLSI devices. The pin-electronics operate up to 1 GHz with the following characteristics; timing error<20 ps, rise/fall time<200 ps, minimum pulse width<500 ps, output voltage range -2.0 V to 3.5 V and output voltage amplitude =3.5 V. This was achieved by reducing to 1/5 the GaAs specific problem of changing gain in the low frequency range. The pin-electronics were implemented as a Driver Comparator Multichip Module in order to achieve a high pin count test head (1280 pins max).