测试超细间距金属键的挑战

R. Sykes
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引用次数: 2

摘要

历史和工业路线图清楚地表明,金属丝之间的间距不断减小。直到最近,满足这一需求的挑战更多地落在了其他过程上,而不是债券测试科学。随着50 /spl mu/m的工业粘合变得普遍,情况不再如此。在实验室中验证了25 /spl mu/m及以下的线材粘合,包括这些线材的剪切和拉力测试。尽管在这些几何形状上使用现有的测试器是可能的,但它们的易用性和准确性正在被推到它们的极限,如果不是超越的话。为了满足日益增长的需求,超细间距线键合被提出作为下一代键合测试仪。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
The challenge of testing ultra fine pitch wire bonds
History and industrial road maps clearly show an ever-decreasing pitch between wire bonds. Until recently, the challenges of meeting this demand have fallen on other processes more than the science of bond testing. With industrial bonding at 50 /spl mu/m becoming common place, this is no longer the case. Wire bonding at 25 /spl mu/m and below is proven in laboratories, including the shear and pull testing of these wires. Although it is possible to use existing testers at these geometry's their ease of use and accuracy is being pushed to, if not beyond, their limits.Ultra Fine Pitch wire bonding is proposed as the next generation bond tester to meet the growing demand.
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