{"title":"用于基于仿真的处理器验证的自动程序生成器","authors":"H. Iwashita, S. Kowatari, T. Nakata, F. Hirose","doi":"10.1109/ATS.1994.367215","DOIUrl":null,"url":null,"abstract":"This paper presents an efficient test program generator for logic simulation that uses techniques developed for formal verification. Our test program generator enumerates all reachable states of a processor pipeline and generates instruction sequences for any reachable test case. The program covers all complicated test cases that are difficult to cover with random instructions and are impossible to cover by conventional test program generation methods.<<ETX>>","PeriodicalId":182440,"journal":{"name":"Proceedings of IEEE 3rd Asian Test Symposium (ATS)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-11-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Automatic program generator for simulation-based processor verification\",\"authors\":\"H. Iwashita, S. Kowatari, T. Nakata, F. Hirose\",\"doi\":\"10.1109/ATS.1994.367215\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents an efficient test program generator for logic simulation that uses techniques developed for formal verification. Our test program generator enumerates all reachable states of a processor pipeline and generates instruction sequences for any reachable test case. The program covers all complicated test cases that are difficult to cover with random instructions and are impossible to cover by conventional test program generation methods.<<ETX>>\",\"PeriodicalId\":182440,\"journal\":{\"name\":\"Proceedings of IEEE 3rd Asian Test Symposium (ATS)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1994-11-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of IEEE 3rd Asian Test Symposium (ATS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ATS.1994.367215\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of IEEE 3rd Asian Test Symposium (ATS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS.1994.367215","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Automatic program generator for simulation-based processor verification
This paper presents an efficient test program generator for logic simulation that uses techniques developed for formal verification. Our test program generator enumerates all reachable states of a processor pipeline and generates instruction sequences for any reachable test case. The program covers all complicated test cases that are difficult to cover with random instructions and are impossible to cover by conventional test program generation methods.<>