采用晶圆级扇出技术的无衬底传感器封装

M. Briindel, U. Scholz, F. Haag, E. Graf, T. Braun, K. Becker
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引用次数: 5

摘要

在本文中,我们提出了一种无衬底封装技术的应用,该技术由ASIC和MEMS芯片的次顺序成型以及在成型化合物上形成再分布层(RDL)组成。加速度传感器和压力传感器是封装的,每种传感器类型都有自己的挑战。对于压力传感器来说,确保周围介质进入压敏膜是至关重要的。这是通过在不改变工艺的情况下构建再分配层来实现的,这使得标准设备和材料的应用相对容易。加速度传感器需要通过硅槽孔进行修改,以适应封装过程。对于重分布层,本文提出了一种与标准薄膜技术并行的加速度传感器封装新方法。通过该工艺制造的所有传感器封装均符合使用相同MEMS dice的标准封装的规格。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Substrateless sensor packaging using wafer level fan-out technology
In this paper, we present the application of a substrateless packaging technology consisting of sub sequential molding of ASIC and MEMS dice und forming redistribution layers (RDL) on the molding compound. Acceleration sensors and pressure sensors were packaged, each sensor type presenting its own challenges. For pressure sensors it is crucial to ensure the access of the surrounding media to the pressure sensitive membrane. This was achieved by structuring the redistribution layer without changing the process, making the application of standard equipment and materials relatively easy. The acceleration sensors needed to be modified by trough silicon vias to fit the packaging process. For the redistribution layer, a novel approach was evaluated in parallel to the standard thin-film technology for the acceleration sensor package. All sensor packages fabricated by the process have been found to be within the specifications of standard packages using the same MEMS dice.
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