一种能在测试中调节IDDQ极限的BIC传感器

2006 15th Asian Test Symposium Pub Date : 2006-11-20 DOI:10.1109/ATS.2006.5

Masato Nakanishi, M. Hashizume, H. Yotsuyanagi, Y. Miura

{"title":"一种能在测试中调节IDDQ极限的BIC传感器","authors":"Masato Nakanishi, M. Hashizume, H. Yotsuyanagi, Y. Miura","doi":"10.1109/ATS.2006.5","DOIUrl":null,"url":null,"abstract":"A built-in-current sensor (BIC sensor) is proposed whose IDDQ limit is able to be adjusted in each IC test. IDDQ tests of identical IDDQ limit can be realized with the current sensor, even if process variation occurs in the sensor. Also, an IDDQ test method is proposed for ICs, in each of which the BIC sensor is implemented. It is shown by some experiments that IDDQ limit of 10mu A will be able to be set and IDDQ test results based on the limit will be obtained by adjusting the limit for each IC if size variation of MOSs in the BIC sensor is less than 50%","PeriodicalId":242530,"journal":{"name":"2006 15th Asian Test Symposium","volume":"37 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-11-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"A BIC Sensor Capable of Adjusting IDDQ Limit in Tests\",\"authors\":\"Masato Nakanishi, M. Hashizume, H. Yotsuyanagi, Y. Miura\",\"doi\":\"10.1109/ATS.2006.5\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A built-in-current sensor (BIC sensor) is proposed whose IDDQ limit is able to be adjusted in each IC test. IDDQ tests of identical IDDQ limit can be realized with the current sensor, even if process variation occurs in the sensor. Also, an IDDQ test method is proposed for ICs, in each of which the BIC sensor is implemented. It is shown by some experiments that IDDQ limit of 10mu A will be able to be set and IDDQ test results based on the limit will be obtained by adjusting the limit for each IC if size variation of MOSs in the BIC sensor is less than 50%\",\"PeriodicalId\":242530,\"journal\":{\"name\":\"2006 15th Asian Test Symposium\",\"volume\":\"37 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2006-11-20\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2006 15th Asian Test Symposium\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ATS.2006.5\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2006 15th Asian Test Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS.2006.5","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 3

摘要

提出了一种内置电流传感器(BIC传感器)，其IDDQ限制可以在每次IC测试中调整。即使在传感器中发生工艺变化，也可以用电流传感器实现相同IDDQ极限的IDDQ测试。此外，还提出了一种集成电路的IDDQ测试方法，并在每个集成电路中实现了BIC传感器。一些实验表明，当BIC传感器中MOSs的尺寸变化小于50%时，可以设置10mu A的IDDQ限值，通过调整每个IC的限值，可以获得基于该限值的IDDQ测试结果

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

A BIC Sensor Capable of Adjusting IDDQ Limit in Tests

A built-in-current sensor (BIC sensor) is proposed whose IDDQ limit is able to be adjusted in each IC test. IDDQ tests of identical IDDQ limit can be realized with the current sensor, even if process variation occurs in the sensor. Also, an IDDQ test method is proposed for ICs, in each of which the BIC sensor is implemented. It is shown by some experiments that IDDQ limit of 10mu A will be able to be set and IDDQ test results based on the limit will be obtained by adjusting the limit for each IC if size variation of MOSs in the BIC sensor is less than 50%

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

2006 15th Asian Test Symposium

自引率

0.00%

发文量