D/ a变换器单事件锁存的实验研究

2019 3rd International Conference on Radiation Effects of Electronic Devices (ICREED) Pub Date : 2019-05-01 DOI:10.1109/ICREED49760.2019.9205160

He Lv, Hongwei Zhang, Yong Li, Xiaoliang Li, Pengwei Li, B. Mei, Qingkui Yu, Yufei Zhang

{"title":"D/ a变换器单事件锁存的实验研究","authors":"He Lv, Hongwei Zhang, Yong Li, Xiaoliang Li, Pengwei Li, B. Mei, Qingkui Yu, Yufei Zhang","doi":"10.1109/ICREED49760.2019.9205160","DOIUrl":null,"url":null,"abstract":"The TLV5638 of TI Company is a D/A Converter. The device is extremely sensitive to space radiation environment. It will be happened single event latch-up. In this work, the single event latch-up effect of TLV5638 of TI Company is studied by using Heavy Ion Accelerator of HI-13. According to its use, the latch-up hardness measures of the current limiting resistor are given. The value range of the current limiting resistor is calculated and the latch-up protection is verified by experiment. It is concluded that single event function interruption and error are more likely to occur when the device is irradiated at lower voltage. The effectiveness of the protection method can automatically restore the working state of the device in the case of uninterrupted power, and the device does not have single event latch-up. According to the results of this study, it can be guaranteed that TLV5638 can avoid single event latchup in space applications.","PeriodicalId":124372,"journal":{"name":"2019 3rd International Conference on Radiation Effects of Electronic Devices (ICREED)","volume":"16 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Experimental Study on Single Event Latch-up of a D/A Converter\",\"authors\":\"He Lv, Hongwei Zhang, Yong Li, Xiaoliang Li, Pengwei Li, B. Mei, Qingkui Yu, Yufei Zhang\",\"doi\":\"10.1109/ICREED49760.2019.9205160\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The TLV5638 of TI Company is a D/A Converter. The device is extremely sensitive to space radiation environment. It will be happened single event latch-up. In this work, the single event latch-up effect of TLV5638 of TI Company is studied by using Heavy Ion Accelerator of HI-13. According to its use, the latch-up hardness measures of the current limiting resistor are given. The value range of the current limiting resistor is calculated and the latch-up protection is verified by experiment. It is concluded that single event function interruption and error are more likely to occur when the device is irradiated at lower voltage. The effectiveness of the protection method can automatically restore the working state of the device in the case of uninterrupted power, and the device does not have single event latch-up. According to the results of this study, it can be guaranteed that TLV5638 can avoid single event latchup in space applications.\",\"PeriodicalId\":124372,\"journal\":{\"name\":\"2019 3rd International Conference on Radiation Effects of Electronic Devices (ICREED)\",\"volume\":\"16 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-05-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2019 3rd International Conference on Radiation Effects of Electronic Devices (ICREED)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICREED49760.2019.9205160\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 3rd International Conference on Radiation Effects of Electronic Devices (ICREED)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICREED49760.2019.9205160","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 0

摘要

TI公司的TLV5638是一款D/ a转换器。该装置对空间辐射环境极为敏感。它将发生在单一事件中。本文利用HI-13的重离子加速器研究了TI公司的TLV5638的单事件锁存效应。根据限流电阻的使用情况，给出了限流电阻锁存硬度的测量方法。计算了限流电阻的取值范围，并通过实验验证了锁存保护的有效性。结果表明，在较低的电压照射下，器件更容易发生单事件功能中断和错误。保护方法的有效性可以在不间断供电的情况下自动恢复设备的工作状态，设备不存在单事件闭锁现象。根据研究结果，可以保证TLV5638在空间应用中能够避免单事件锁存。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

Experimental Study on Single Event Latch-up of a D/A Converter

The TLV5638 of TI Company is a D/A Converter. The device is extremely sensitive to space radiation environment. It will be happened single event latch-up. In this work, the single event latch-up effect of TLV5638 of TI Company is studied by using Heavy Ion Accelerator of HI-13. According to its use, the latch-up hardness measures of the current limiting resistor are given. The value range of the current limiting resistor is calculated and the latch-up protection is verified by experiment. It is concluded that single event function interruption and error are more likely to occur when the device is irradiated at lower voltage. The effectiveness of the protection method can automatically restore the working state of the device in the case of uninterrupted power, and the device does not have single event latch-up. According to the results of this study, it can be guaranteed that TLV5638 can avoid single event latchup in space applications.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

2019 3rd International Conference on Radiation Effects of Electronic Devices (ICREED)

自引率

0.00%

发文量