一种测量砷化镓体电阻器热阻的技术

2000 GaAs Reliability Workshop. Proceedings (IEEE Cat. No.00TH8513) Pub Date : 2000-11-05 DOI:10.1109/GAASRW.2000.902421

E. Sabin, J. Scarpulla, Y. Chou, G. Shimamoto

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引用次数: 2

摘要

提出了一种测量GaAs体电阻热阻的电学方法。测定了几种电阻器的热阻。讨论了这些结果与液晶法的差异。然后，研究了自热对电阻可靠性的影响。

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A technique for electrically measuring the thermal resistance of GaAs bulk resistors

An electrical technique to measure the thermal resistance of GaAs bulk resistors is presented. The thermal resistance of several resistors was determined. The difference in these results relative to a liquid crystal method is discussed. Then, the reliability impact on the resistors from self-heating is studied.

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来源期刊

2000 GaAs Reliability Workshop. Proceedings (IEEE Cat. No.00TH8513)

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