在宽频率范围内测量vlsi的电源电流和内部阻抗

2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03. Pub Date : 2003-05-16 DOI:10.1109/ICSMC2.2003.1428204

J. Held, B. Unger

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引用次数: 2

摘要

为了模拟pcb(印刷电路板)的发射，有必要在很宽的频率范围内非常精确地描述射频源。由于超大规模集成电路的内部开关，在其电源引脚上可以看到大量的射频噪声。这些电流I(f)取决于VLSI供电系统的阻抗Z(f)和VLSI供电引脚处进入PCB供电系统的Z(f)之间的关系。本文描述了一种测量VLSI的Z(f)和I(f)的有效方法，并将其与从VLSI的几何数据中提取Z(f)进行了比较

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Measurement of the supply-current and internal impedance of VLSIs in a wide frequency range

In order to simulate the emission of PCBs (printed circuit boards) it is necessary to describe the RF-(radio-frequency)-sources very exactly in a wide frequency range. Due to internal switching of VLSIs a lot of RF-noise can be seen on their supply-pins. These currents I(f) are dependent on the relationship between the impedance Z(f) of the supply-system of the VLSI and Z(f) into the supply-system of the PCB at the supply-pins of the VLSI. This paper describes an effective method to measure both Z(f) and I(f) of the VLSI and compares it to extraction of Z(f) from the VLSI's geometrical data

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2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03.

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