{"title":"采用三种互连技术的高速缓存系统的性能建模:氰酸酯PCB,片上芯片和Cu/PI MCM","authors":"J. Shiao, D. Nguyen","doi":"10.1109/MCMC.1992.201467","DOIUrl":null,"url":null,"abstract":"To understand the tradeoffs in different interconnect technologies, and to investigate the applicability of MCM (multi-chip module) technology to high performance computer products, an electrical performance modeling study on a cache system using three interconnect technologies was conducted. The three technologies were a high density cyanate ester PCB; chip-on-board; and a copper/polyimide MCM with high-density connectors. Placements and layouts for the cache system, using three interconnect technologies, have been done. Active buffer models and interconnect models have been developed. The performance modeling results, including the interconnect, input/output buffers, critical path delays, and the signal integrity assessment, are presented.<<ETX>>","PeriodicalId":202574,"journal":{"name":"Proceedings 1992 IEEE Multi-Chip Module Conference MCMC-92","volume":"8 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-03-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"13","resultStr":"{\"title\":\"Performance modeling of a cache system with three interconnect technologies: cyanate ester PCB, chip-on-board and Cu/PI MCM\",\"authors\":\"J. Shiao, D. Nguyen\",\"doi\":\"10.1109/MCMC.1992.201467\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"To understand the tradeoffs in different interconnect technologies, and to investigate the applicability of MCM (multi-chip module) technology to high performance computer products, an electrical performance modeling study on a cache system using three interconnect technologies was conducted. The three technologies were a high density cyanate ester PCB; chip-on-board; and a copper/polyimide MCM with high-density connectors. Placements and layouts for the cache system, using three interconnect technologies, have been done. Active buffer models and interconnect models have been developed. The performance modeling results, including the interconnect, input/output buffers, critical path delays, and the signal integrity assessment, are presented.<<ETX>>\",\"PeriodicalId\":202574,\"journal\":{\"name\":\"Proceedings 1992 IEEE Multi-Chip Module Conference MCMC-92\",\"volume\":\"8 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1992-03-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"13\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings 1992 IEEE Multi-Chip Module Conference MCMC-92\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MCMC.1992.201467\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings 1992 IEEE Multi-Chip Module Conference MCMC-92","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MCMC.1992.201467","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Performance modeling of a cache system with three interconnect technologies: cyanate ester PCB, chip-on-board and Cu/PI MCM
To understand the tradeoffs in different interconnect technologies, and to investigate the applicability of MCM (multi-chip module) technology to high performance computer products, an electrical performance modeling study on a cache system using three interconnect technologies was conducted. The three technologies were a high density cyanate ester PCB; chip-on-board; and a copper/polyimide MCM with high-density connectors. Placements and layouts for the cache system, using three interconnect technologies, have been done. Active buffer models and interconnect models have been developed. The performance modeling results, including the interconnect, input/output buffers, critical path delays, and the signal integrity assessment, are presented.<>