视尺寸相关性:一种使用常规显微镜确定粒子垂直位置的简单方法

2014 IEEE 27th International Conference on Micro Electro Mechanical Systems (MEMS) Pub Date : 2014-03-13 DOI:10.1109/MEMSYS.2014.6765797

Michael H. Winer, A. Ahmadi, K. Cheung

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引用次数: 2

摘要

本文报道了一种简单而广泛应用的粒子跟踪技术，利用常规荧光显微镜来确定悬浮在流体中的粒子的垂直位置。该领域以前的实验工作仅限于二维强度分布或三维跟踪的共聚焦和立体设置。利用基于校准的离焦方法，我们的技术已经得到了实验验证，并与先前观察到的惯性流聚焦趋势进行了比较。该技术已被证明是一种简单而有价值的工具，用于确定微尺度流动中微米级颗粒的位置。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Apparent size correlation: A simple method to determine vertical positions of particles using conventional microscopy

This paper reports a simple and widely applicable particle tracking technique using conventional fluorescence microscopy to determine vertical positions of particles suspended in a fluid. Previous experimental work in this area has been restricted to two-dimensional intensity profiles or confocal and stereoscopic setups for three-dimensional tracking. Using a calibration-based defocusing method, our technique has been experimentally verified and compared with previously observed trends in inertial flow focusing. The technique has proven to be a simple and valuable tool for determining locations of micron-sized particles in microscale flows.

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来源期刊

2014 IEEE 27th International Conference on Micro Electro Mechanical Systems (MEMS)

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