内存测试调试测试向量没有ATE

Proceedings International Test Conference 1997 Pub Date : 1997-11-01 DOI:10.1109/TEST.1997.639678

Steve Westfall

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引用次数: 1

摘要

提出了一种不使用自动测试设备(ATE)调试存储器件功能生产测试向量的方法。所描述的方法涉及数字仿真环境的使用;响应式硬件描述语言(HDL) ATE模型;ATE规则检查。该方法允许快速调试矢量和其余程序流，而不需要使用ATE资源。

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Memory test-debugging test vectors without ATE

A method for debugging functional production test vectors for memory devices without the use of Automated Test Equipment (ATE) is presented. The method described involves the use of a digital simulation environment; a reactive Hardware Description Language (HDL) ATE model; and ATE rules checking. The method allows for rapidly debugging vectors and rest program flows without requiring the use of ATE resources.

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来源期刊

Proceedings International Test Conference 1997

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