超低环路铜丝性能与行为的表征

M.N.M. Ching, L. Ying
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引用次数: 0

摘要

热影响区(HAZ)是线圈形成过程中主要关注的问题。线材绕圈是一个涉及机器机械运动和线材物理弯曲的过程。通常,为了避免机械应力引起的失效,大多数钢丝环工艺设置将倾向于避免热影响区。影响热影响区长度的因素有很多。Sun等人的研究表明,电子火焰熄灭(EFO)时间的增加与热影响区长度的增加成正比。超低环在HAZ区域的铜球键的顶部引入了极端弯曲工艺。由于线材的折叠、弯曲和压缩的影响,线材的缩颈或断裂是主要的问题。本文的主要重点将讨论超低环路的细节和全面特性,在22um铜线中低至40-50um高度,在工艺能力和坚固性,材料性能和行为(例如:晶粒结构)以及机械性能(例如:硬度和强度)方面。将讨论和解释常见的分析方法和材料制备设置误差,以了解所获得的数据变化背后的原因。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Characterization on ultra low loop Cu wire property and behavior
The heat affected zone (HAZ) is the major concern during wire loop formation. Wire looping is a process that involves machine mechanical movement as well as wire physical bending. Commonly, in order to avoid failure caused by mechanical stresses, most of the wire loop process setup will tend to avoid the HAZ. There are several factors contributing towards the length of HAZ. A study done by Sun et. al. explains that the increase of electron flame off (EFO) time is proportional towards the increase of HAZ length. Ultra low loop introduced an extreme bending process on top of the copper ball bond at the HAZ area. Wire necking or fracture is the major concern due to the effect of folding, bending and compression of the wire. The main focus of this paper will discuss on the detail and thorough characterization of ultra low loop, as low as 40-50um height in 22um copper wire in terms of process capability & robustness, material property & behavior (e.g.: grain structure) as well as the mechanical property (e.g.: hardness & strength). Common analytical method and material preparation setup error will be discussed and explained to understand the reasons behind in the data variations obtained.
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