工业混合信号集成电路缺陷导向测试与ICCQ测试的实现

16th Asian Test Symposium (ATS 2007) Pub Date : 2007-10-08 DOI:10.1109/ATS.2007.93

L. Fang, Yang Zhong, H. V. D. Donk, Y. Xing

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引用次数: 9

摘要

在零缺陷时代，ICCQ是实现高测试覆盖率和最高产品质量的强大的非规范测试方法之一。在本项目中，基于缺陷导向测试(DOT)技术的故障模拟，选择了具有最有效覆盖率改进的当前测试并在生产测试流程中实施。

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Implementation of Defect Oriented Testing and ICCQ testing for industrial mixed-signal IC

In the era of Zero Defects, ICCQ is one of the powerful non-specification based testing methods to achieve high test coverage and supreme product quality. Within this project, based on the fault simulation with Defect Oriented Test (DOT) technique, the current tests with the most efficient coverage improvements have been selected and implemented in the production testing flow.

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16th Asian Test Symposium (ATS 2007)

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