关于2019 IEEE第28届亚洲测试研讨会

{"title":"关于2019 IEEE第28届亚洲测试研讨会","authors":"","doi":"10.1109/ats47505.2019.00005","DOIUrl":null,"url":null,"abstract":"The main goal of organizing IEEE Asian Test Symposium (ATS 2019) is to promote discussions and scientific exchange of knowledge between researchers, developers, engineers, academicians, and students working in India and abroad. ATS 2019 hopes to address design, test, and yield challenges faced by the industry with the combined efforts of academia, design tool and equipment suppliers, designers, and test engineers.","PeriodicalId":258824,"journal":{"name":"2019 IEEE 28th Asian Test Symposium (ATS)","volume":"30 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"About the 2019 IEEE 28th Asian Test Symposium\",\"authors\":\"\",\"doi\":\"10.1109/ats47505.2019.00005\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The main goal of organizing IEEE Asian Test Symposium (ATS 2019) is to promote discussions and scientific exchange of knowledge between researchers, developers, engineers, academicians, and students working in India and abroad. ATS 2019 hopes to address design, test, and yield challenges faced by the industry with the combined efforts of academia, design tool and equipment suppliers, designers, and test engineers.\",\"PeriodicalId\":258824,\"journal\":{\"name\":\"2019 IEEE 28th Asian Test Symposium (ATS)\",\"volume\":\"30 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2019 IEEE 28th Asian Test Symposium (ATS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ats47505.2019.00005\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 IEEE 28th Asian Test Symposium (ATS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ats47505.2019.00005","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

组织IEEE亚洲测试研讨会(ATS 2019)的主要目标是促进在印度和国外工作的研究人员、开发人员、工程师、院士和学生之间的讨论和科学知识交流。ATS 2019希望通过学术界、设计工具和设备供应商、设计师和测试工程师的共同努力,解决行业面临的设计、测试和良率挑战。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
About the 2019 IEEE 28th Asian Test Symposium
The main goal of organizing IEEE Asian Test Symposium (ATS 2019) is to promote discussions and scientific exchange of knowledge between researchers, developers, engineers, academicians, and students working in India and abroad. ATS 2019 hopes to address design, test, and yield challenges faced by the industry with the combined efforts of academia, design tool and equipment suppliers, designers, and test engineers.
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