采用内置自校准技术的12位32MS/s SAR ADC,可最大限度地减少电容失配

In-Seok Jung, Yong-Bin Kim
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引用次数: 9

摘要

本文提出了一种低功耗12位32MS/s逐次逼近寄存器(SAR)模数转换器(ADC),采用单输入,具有新颖的内置自校准(BiSC)功能,以减少数模转换器(DAC)的电容失配并补偿比较器输入偏置电压。提出的自校准方案通过在校准模式下改变额外的辅助电容阵列来优化DAC的失配。此外,为了减小比较器在SAR ADC中的偏置电压,提出了一种简化的电压放大器。该算法的控制器采用前台操作,实现了较低的功耗。因此,DAC的失配误差可以最小化,并且基于SAR的ADC在正常工作期间没有任何额外的自校准电路功耗。该原型机采用0.13μm单聚6金属标准CMOS技术设计。在1.2V电源电压和32 MS/s采样速率下,ADC的SNDR为65.2 dB,功耗为3.57 mW。与使用传统程序的转换器相比,INL和DNL分别降低了约45%和51%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A 12-bit 32MS/s SAR ADC using built-in self calibration technique to minimize capacitor mismatch
This paper presents a low-power 12-bit 32MS/s successive approximation register (SAR) analog-to-digital converter (ADC) using a single input with a novel Built-in Self Calibration (BiSC) feature to reduce the capacitor mismatch of the digital-to-analog converter (DAC) and to compensate the comparator input offset voltage. The proposed self-calibration scheme optimize the mismatch of the DAC by changing additional auxiliary capacitor array during calibration mode. In addition, in order to minimize the offset voltage of the comparator in the SAR ADC, a simplified voltage amplifier is proposed. The controller for the proposed algorithm operates as fore-ground operation so that low power consumption is achieved. Consequently, the mismatch error of the DAC can be minimized and the SAR based ADC operates without any extra power dissipation for the circuitry of self calibration during normal operation. The prototype was designed using 0.13μm single poly 6 metal standard CMOS technology. The ADC achieves a SNDR of 65.2 dB and consumes 3.57 mW with 1.2V supply voltage and sampling rate of 32 MS/s. Compared to the converters that use the conventional procedure, INL and DNL are reduced by about 45% and 51%, respectively.
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